Towards highest quality standards of determination and control of lead content in raw materials for cosmetic applications

IF 3.8 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2025-07-15 DOI:10.1016/j.sab.2025.107276

Paweł Wróbel , Anna Osojca , Katarzyna M. Sowa , Tomasz Kołodziej , Paweł Korecki , Wiktoria Tokarczyk , Zbigniew Inglot , Magdalena Kluz-Pękalska , Jakub Szlachetko

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Abstract

The goal of this research was to establish feasibility of determination and quantification of lead in the raw mixed materials for cosmetic applications by synchrotron radiation induced X-ray fluorescence (SR-XRF). The penetrating properties of X-rays, allow to measure the samples as delivered with minimal intervention in the sample material and no need for any pre-treatment processes. The established quantification scheme has been based on the emission-transmission experiment. The measurements have been done at multimodal PolyX beamline of Solaris National Synchrotron Radiation Centre in Krakow, Poland. Apart of the samples reference materials with similar lead content have been analysed, with the recovery values in range of 67 % to 133 % achieved. We have determined the detection limits for the lead content at μg/g level for only few minutes of acquisition in a relatively complex matrix of sample material. The obtained result implies that the SR-XRF station can be effectively used for quality control and efficient screening of hundreds of samples of cosmetic materials in a short acquisition times.

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迈向化妆品原料铅含量测定和控制的最高质量标准

本研究的目的是建立同步辐射诱导x射线荧光（SR-XRF）测定化妆品原料中铅的可行性。x射线的穿透特性，允许在样品材料的最小干预下测量样品，不需要任何预处理过程。所建立的量化方案是基于发射传输实验。测量是在波兰克拉科夫Solaris国家同步辐射中心的多模态PolyX光束线上完成的。对部分铅含量相近的样品进行了分析，回收率在67% ~ 133%之间。在相对复杂的样品材料基质中，我们仅在几分钟的采集时间内确定了μg/g水平铅含量的检出限。结果表明，SR-XRF站可在较短的采集时间内对数百种化妆品样品进行有效的质量控制和高效筛选。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.