A high throughput and micrometre spatial resolution design for a versatile resonant inelastic X-ray scattering spectrometer.

Abstract

A versatile scheme has been meticulously engineered for a resonant inelastic X-ray scattering spectrometer, enabling free switching between high throughput configurations with narrow spatial-resolution and low throughput setups boasting broad spatial-resolution capabilities. The high throughput mode enhances signal intensity threefold compared with setups with only the dispersive subassembly, while achieving 2.7 µm resolution within a 16 µm range. Alternatively, the broad spatial-resolution mode achieves 2.7 µm resolution across the entire optical footprint. Furthermore, the incorporation of specialized mirrors not only facilitates focusing but also paves the way for potential enhancements to the strip-shaped detector, thereby augmenting its resolution. By employing a vertically compact beam spot in conjunction with the Hettrick-Underwood optical configuration, this spectrometer attains a resolving power surpassing 12000 for 284-780 eV. This work provides an exhaustive exploration of the multifaceted attributes to the spectrometer's optical design, highlighting its adaptability and high performance in diverse experimental scenarios.