Deterministic quantum dot cavity placement using hyperspectral imaging with high spatial accuracy and precision

IF 11 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Quirin Buchinger, Constantin Krause, Aileen Zhang, Giora Peniakov, Mohamed Helal, Yorick Reum, Andreas Theo Pfenning, Sven Höfling, Tobias Huber-Loyola
{"title":"Deterministic quantum dot cavity placement using hyperspectral imaging with high spatial accuracy and precision","authors":"Quirin Buchinger,&nbsp;Constantin Krause,&nbsp;Aileen Zhang,&nbsp;Giora Peniakov,&nbsp;Mohamed Helal,&nbsp;Yorick Reum,&nbsp;Andreas Theo Pfenning,&nbsp;Sven Höfling,&nbsp;Tobias Huber-Loyola","doi":"10.1186/s40580-025-00501-5","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>Single emitters in solid state are promising sources of single and entangled photons. To boost their extraction efficiency and tailor their emission properties, they are often incorporated in photonic nanostructures. However, achieving accurate and reproducible placement inside the cavity is challenging but necessary to ensure the highest mode overlap and optimal device performance. For many cavity types —such as photonic crystal cavities or circular Bragg grating cavities — even small displacements lead to a significantly reduced emitter-cavity coupling. For circular Bragg grating cavities, this yields a significant reduction in Purcell effect, a slight reduction in efficiency and it introduces polarization on the emitted photons. Here we show a method to achieve high accuracy and precision for deterministically placed cavities on the example of circular Bragg gratings on randomly distributed semiconductor quantum dots. We introduce periodic alignment markers for improved marker detection accuracy and investigate overall imaging accuracy achieving (9.1 ± 2.5) nm through image correction. Since circular Bragg grating cavities exhibit a strong polarization response when the emitter is displaced, they are ideal devices to probe the cavity placement accuracy far below the diffraction limit. From the measured device polarizations, we derive a total spatial process accuracy of (33.5 ± 9.9) nm based on the raw data, and an accuracy of (15 ± 11) nm after correcting for the system response, resulting in a device yield of 68% for well-placed cavities.</p>\n </div>","PeriodicalId":712,"journal":{"name":"Nano Convergence","volume":"12 1","pages":""},"PeriodicalIF":11.0000,"publicationDate":"2025-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12267725/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Convergence","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1186/s40580-025-00501-5","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

Single emitters in solid state are promising sources of single and entangled photons. To boost their extraction efficiency and tailor their emission properties, they are often incorporated in photonic nanostructures. However, achieving accurate and reproducible placement inside the cavity is challenging but necessary to ensure the highest mode overlap and optimal device performance. For many cavity types —such as photonic crystal cavities or circular Bragg grating cavities — even small displacements lead to a significantly reduced emitter-cavity coupling. For circular Bragg grating cavities, this yields a significant reduction in Purcell effect, a slight reduction in efficiency and it introduces polarization on the emitted photons. Here we show a method to achieve high accuracy and precision for deterministically placed cavities on the example of circular Bragg gratings on randomly distributed semiconductor quantum dots. We introduce periodic alignment markers for improved marker detection accuracy and investigate overall imaging accuracy achieving (9.1 ± 2.5) nm through image correction. Since circular Bragg grating cavities exhibit a strong polarization response when the emitter is displaced, they are ideal devices to probe the cavity placement accuracy far below the diffraction limit. From the measured device polarizations, we derive a total spatial process accuracy of (33.5 ± 9.9) nm based on the raw data, and an accuracy of (15 ± 11) nm after correcting for the system response, resulting in a device yield of 68% for well-placed cavities.

Abstract Image

Abstract Image

Abstract Image

利用高光谱成像技术确定量子点空腔定位,具有较高的空间精度和精度。
固体中的单发射体是很有前途的单光子和纠缠光子源。为了提高它们的萃取效率和调整它们的发射特性,它们经常被加入到光子纳米结构中。然而,在腔内实现精确和可重复的放置是具有挑战性的,但必须确保最高的模式重叠和最佳的器件性能。对于许多腔型,如光子晶体腔或圆形布拉格光栅腔,即使很小的位移也会导致发射腔耦合显著降低。对于圆形布拉格光栅腔,这产生了Purcell效应的显著降低,效率略有降低,并且在发射的光子上引入了极化。本文以随机分布的半导体量子点上的圆形Bragg光栅为例,给出了一种实现确定性放置空腔高精度和精密度的方法。我们引入了周期性对准标记来提高标记检测精度,并研究了通过图像校正实现(9.1±2.5)nm的整体成像精度。由于圆形布拉格光栅腔体在发射极位移时表现出强烈的极化响应,因此是探测远低于衍射极限的腔体放置精度的理想器件。根据测量的器件偏振,我们得出基于原始数据的总空间工艺精度为(33.5±9.9)nm,校正系统响应后的精度为(15±11)nm,从而使器件良率达到68%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Nano Convergence
Nano Convergence Engineering-General Engineering
CiteScore
15.90
自引率
2.60%
发文量
50
审稿时长
13 weeks
期刊介绍: Nano Convergence is an internationally recognized, peer-reviewed, and interdisciplinary journal designed to foster effective communication among scientists spanning diverse research areas closely aligned with nanoscience and nanotechnology. Dedicated to encouraging the convergence of technologies across the nano- to microscopic scale, the journal aims to unveil novel scientific domains and cultivate fresh research prospects. Operating on a single-blind peer-review system, Nano Convergence ensures transparency in the review process, with reviewers cognizant of authors' names and affiliations while maintaining anonymity in the feedback provided to authors.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信