Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices

Abstract

We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations.