Cascode subthreshold PTAT source bandgap voltage reference circuit

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Komal Duhan, Neelam Rup Prakash, Jasbir Kaur, Sameeksha Munjal
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引用次数: 0

Abstract

Bandgap Voltage reference (BGR) are crucial components in analog circuits. This paper introduces a BGR circuit designed in the subthreshold region using Cadence Generic Process Design Kits (GPDK) 90 nm technology. The cascoding technique is used to remove channel length modulation effect to get stable output voltage for a wider range of temperature and supply voltage. The proposed circuit produces a reference voltage of 344 mV, consuming 94.64 nW power at room temperature with a supply voltage starting from 550 mV. The temperature coefficient is measured to be 8.337 ppm/OC within a temperature range of −45 OC to 170 OC with a line regulation of 0.017 %/V. The designed BGR circuit can be used in analog applications.
级联码亚阈值PTAT源带隙电压参考电路
带隙基准电压(BGR)是模拟电路中的关键元件。本文介绍了一种采用Cadence通用工艺设计套件(GPDK) 90 nm技术在亚阈值区域设计的BGR电路。采用级联编码技术消除通道长度调制效应,在较宽的温度和电源电压范围内获得稳定的输出电压。该电路产生的参考电压为344 mV,在室温下,电源电压为550 mV,功耗为94.64 nW。测量温度系数为8.337 ppm/OC,温度范围为- 45 OC ~ 170 OC,线性调节为0.017% /V。所设计的BGR电路可用于模拟应用。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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