{"title":"Evaluation of gamma- and neutron radiation emissions during proton irradiation of typical metals in semiconductor manufacturing","authors":"Andrea Fugger , Moriz Jelinek , Markus Valtiner","doi":"10.1016/j.nimb.2025.165777","DOIUrl":null,"url":null,"abstract":"<div><div>Proton implantation has multiple uses in semiconductor manufacturing. Implanting through metallization can create problems in terms of radiation safety. Gamma and neutron emissions for proton irradiated stacks of Ti, TiN, W, AlCu, Si, Co with incident proton energies of 1<!--> <!-->MeV to 2<!--> <!-->MeV were measured. The most intense gamma lines resulted from Al, Si, F and Ti. Despite being present in trace amounts, F was found to contribute significantly to the gamma emission. Our results indicate a need for new metallization concepts to be used together with proton implantation.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"566 ","pages":"Article 165777"},"PeriodicalIF":1.4000,"publicationDate":"2025-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0168583X25001673","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Proton implantation has multiple uses in semiconductor manufacturing. Implanting through metallization can create problems in terms of radiation safety. Gamma and neutron emissions for proton irradiated stacks of Ti, TiN, W, AlCu, Si, Co with incident proton energies of 1 MeV to 2 MeV were measured. The most intense gamma lines resulted from Al, Si, F and Ti. Despite being present in trace amounts, F was found to contribute significantly to the gamma emission. Our results indicate a need for new metallization concepts to be used together with proton implantation.
期刊介绍:
Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.