An empirical-parameter-free approach toward quantitative in situ electron tomography data analysis: in situ observation of metal nanoparticle sintering

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Shiro Ihara , Shunsuke Sato , Mizumo Yoshinaga , Mitsuhiro Murayama
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引用次数: 0

Abstract

Metal nanoparticles (NPs) exhibit multiple unique technological characteristics compared to their bulk or micrometer counterparts, such as coalescing or sintering at lower temperatures. This enables low-cost manufacturing of electronic products by using NPs as nano pastes. Three-dimensional (3D) observation of their dynamic sintering process is an emerging approach to deepen our scientific and technological understanding of the different pathways underlying sintering phenomena at the nanoscale. However, quantitatively evaluating the details of NP ensembles, including measurements of neck length, relative geometrical features of the NPs, initial dispersion, and their relative positions, from 3D data remains labor-intense and error prone so far due to the non-uniformity of both NP shape and their distribution, as well as the large volume of data. Here, we developed an empirical-parameter-free scheme for the quantitative evaluation of microstructural parameters in 3D that characterize neck growth and densification. The developed scheme was based only on a few relatively simple mathematical assumptions, such as the center point of any geometry being the farthest from the outside of the geometry, and the neck being a flat plane formed between NPs. This paper demonstrates the successful extraction of both the neck and the connectivity of NP ensembles from in situ scanning transmission electron microscopy (STEM) tomography data, providing a quantitative description of NPs’ coalescing/sintering behavior.
定量原位电子断层扫描数据分析的无经验参数方法:金属纳米颗粒烧结的原位观察
金属纳米颗粒(NPs)与它们的块状或微米颗粒相比,具有多种独特的技术特征,例如在较低温度下的聚结或烧结。这使得利用NPs作为纳米浆料的电子产品的低成本制造成为可能。三维(3D)观察它们的动态烧结过程是一种新兴的方法,可以加深我们对纳米级烧结现象背后不同途径的科学和技术理解。然而,由于NP形状及其分布的不均匀性以及数据量大,从3D数据中定量评估NP集合的细节,包括颈部长度的测量、NP的相对几何特征、初始离散度及其相对位置,到目前为止仍然是劳动密集型和容易出错的。在这里,我们开发了一种无经验参数的方案,用于定量评估表征颈部生长和致密化的三维显微结构参数。开发的方案仅基于几个相对简单的数学假设,例如任何几何形状的中心点距离几何形状的外部最远,颈部是NPs之间形成的平面。本文展示了从原位扫描透射电子显微镜(STEM)断层扫描数据中成功提取NP系综的颈部和连通性,为NP系综的聚结/烧结行为提供了定量描述。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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