{"title":"Microwave Annealing-Enabled Defect Healing for High-Performance and Stable Organic Transistors and Circuits.","authors":"Yao Fu, Yanpeng Wang, Shougang Sun, Yajing Sun, Jiannan Qi, Yongxu Hu, Shuaishuai Ding, Zhongwu Wang, Yinan Huang, Wenping Hu, Xiaosong Chen, Hui Yang, Liqiang Li","doi":"10.1002/smtd.202500515","DOIUrl":null,"url":null,"abstract":"<p><p>Organic field-effect transistors (OFETs) are promising candidates for use in next-generation electronic devices. However, organic semiconductors (OSCs) exhibit low crystallinity and weak van der Waals (vdW) forces, which makes them prone to defect formation, resulting in localized states in the bandgap that can trap charge carriers. This seriously limits the performance and stability of OFETs, which typically exhibit high contact resistance (R<sub>c</sub>) and poor operational stability. It is highly desirable, but challenging, to eliminate defects in OSCs. Herein, a microwave annealing strategy is presented that heals defects in OSCs near the electrode/OSC interface through co-associated high-frequency vibration. By using this technique, the trap density of states (DOS) is significantly reduced and coplanar OFETs achieve an ultralow R<sub>c</sub>·W of 20 Ω cm and a high mobility of 10.57 cm<sup>2</sup> V<sup>-1</sup> s<sup>-1</sup>. Moreover, the on-state current of the OFET retained 99% of its initial value after 10 000 s of constant bias stress, and the switching voltage of the biased-load inverters hardly shifted after cycle tests, demonstrating excellent operational stability. The high-efficiency, uniform heating, and low-temperature processing strategy has great application prospects in organic devices and circuits.</p>","PeriodicalId":229,"journal":{"name":"Small Methods","volume":" ","pages":"e2500515"},"PeriodicalIF":10.7000,"publicationDate":"2025-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Small Methods","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/smtd.202500515","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
Abstract
Organic field-effect transistors (OFETs) are promising candidates for use in next-generation electronic devices. However, organic semiconductors (OSCs) exhibit low crystallinity and weak van der Waals (vdW) forces, which makes them prone to defect formation, resulting in localized states in the bandgap that can trap charge carriers. This seriously limits the performance and stability of OFETs, which typically exhibit high contact resistance (Rc) and poor operational stability. It is highly desirable, but challenging, to eliminate defects in OSCs. Herein, a microwave annealing strategy is presented that heals defects in OSCs near the electrode/OSC interface through co-associated high-frequency vibration. By using this technique, the trap density of states (DOS) is significantly reduced and coplanar OFETs achieve an ultralow Rc·W of 20 Ω cm and a high mobility of 10.57 cm2 V-1 s-1. Moreover, the on-state current of the OFET retained 99% of its initial value after 10 000 s of constant bias stress, and the switching voltage of the biased-load inverters hardly shifted after cycle tests, demonstrating excellent operational stability. The high-efficiency, uniform heating, and low-temperature processing strategy has great application prospects in organic devices and circuits.
Small MethodsMaterials Science-General Materials Science
CiteScore
17.40
自引率
1.60%
发文量
347
期刊介绍:
Small Methods is a multidisciplinary journal that publishes groundbreaking research on methods relevant to nano- and microscale research. It welcomes contributions from the fields of materials science, biomedical science, chemistry, and physics, showcasing the latest advancements in experimental techniques.
With a notable 2022 Impact Factor of 12.4 (Journal Citation Reports, Clarivate Analytics, 2023), Small Methods is recognized for its significant impact on the scientific community.
The online ISSN for Small Methods is 2366-9608.