Development of slope detection ASIC for on-chip current sensing in voltage converters

IF 2.2 3区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

Integration-The Vlsi Journal Pub Date : 2025-07-07 DOI:10.1016/j.vlsi.2025.102471

Richard Ravasz, Viera Stopjakova, David Maljar, Daniel Arbet, Lukas Nagy, Martin Kovac

引用次数: 0

Abstract

This research centers on the design and analysis of an on-chip indirect approach aimed at estimating the output load current in a DC–DC flyback converter. This indirect method for estimating electric current relies on assessing the slope of the output voltage from the converter on the external filter capacitor during discharge phases. Consequently, this slope data can be effectively harnessed to control the converter’s switches. The proposed circuit operates on a power supply of 1.2 V and was designed using standard 65 nm CMOS technology. The designed slope detector circuit has the capability of measuring current within the range of one to hundreds of milliamperes. Given its predominantly digital nature, the circuit provides inherent robustness against variations in process, temperature, and supply voltage.

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用于电压变换器片上电流传感的斜率检测专用集成电路的研制

本研究的核心是设计和分析一种片上间接方法，旨在估计DC-DC反激变换器的输出负载电流。这种估算电流的间接方法依赖于在放电阶段评估变换器在外部滤波电容器上的输出电压的斜率。因此，可以有效地利用该斜率数据来控制变换器的开关。该电路工作在1.2 V的电源上，采用标准的65纳米CMOS技术设计。所设计的斜率检测器电路具有测量1到数百毫安范围内电流的能力。鉴于其主要的数字性质，电路提供了固有的鲁棒性，以应对工艺，温度和电源电压的变化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Integration-The Vlsi Journal 工程技术-工程：电子与电气

CiteScore

3.80

自引率

5.30%

发文量

107

审稿时长

6 months

期刊介绍： Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.