Design and evaluation of a novel Faraday cup for easy and accurate beam current measurement in a transmission electron microscope

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Ehsan Nikbin , Dian Yu , Ilya Gourevich , Stas Dogel , R.J. Dwayne Miller , Jane Y. Howe
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Abstract

Beam current measurement is a crucial step in estimating the electron dose when studying beam-sensitive samples in electron microscopy. A Faraday cup is a standard tool for measuring beam current; however, commercially available Faraday cups for transmission electron microscopes (TEM) are limited, expensive, and often difficult to use as the cup itself is invisible in the TEM. We herein present a new Faraday cup design that fits into an insulated TEM holder of Hitachi HT7700 and HT7800 series and can be easily located using four symmetrical through holes around the cup. This design also accommodates the 3 mm TEM mesh grid in the holder and allows both sample imaging and access to the Faraday cup within the TEM stage movement range. We evaluated the effectiveness of our Faraday cup in capturing the electron beam by varying the diameter to depth ratio and material of the Faraday cup through experimental measurements and Monte Carlo simulations, demonstrating an accuracy better than 1–2 %. The preferred configuration is an aluminum cup with a diameter of 0.2 mm and a depth of 0.8 mm. Monte Carlo simulations also suggest that this Faraday cup provides accurate beam current measurement at different electron energies. Our novel Faraday cup design provides a practical, simple, and cost-effective solution for beam current measurement in a TEM.
一种新型的法拉第杯的设计和评价,用于在透射电子显微镜中方便和准确地测量光束电流
电子束电流测量是研究电子束敏感样品时估计电子剂量的关键步骤。法拉第杯是测量光束电流的标准工具;然而,市售的用于透射电子显微镜(TEM)的法拉第杯是有限的,昂贵的,而且通常很难使用,因为杯子本身在TEM中是不可见的。我们在此提出了一种新的法拉第杯设计,该设计适合日立HT7700和HT7800系列的绝缘TEM支架,并且可以在杯周围使用四个对称通孔轻松定位。这种设计还可以在支架中容纳3 mm的TEM网格,并允许样品成像和在TEM阶段移动范围内访问法拉第杯。通过实验测量和蒙特卡罗模拟,我们通过改变法拉第杯的直径与深度比和材料来评估法拉第杯捕获电子束的有效性,证明其精度优于1-2 %。首选配置是直径为0.2 mm,深度为0.8 mm的铝杯。蒙特卡罗模拟还表明,这种法拉第杯在不同的电子能量下提供了精确的电子束电流测量。我们新颖的法拉第杯设计为TEM中的光束电流测量提供了实用,简单且具有成本效益的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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