On the utility of complementary analytics for on-surface synthesis.

IF 8 2区 材料科学 Q1 CHEMISTRY, PHYSICAL
Markus Lackinger
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引用次数: 0

Abstract

On-surface synthesis (OSS) facilitates the coupling of larger molecules on solid surfaces into extended covalent nanostructures that are difficult or impossible to achieve by wet chemistry. Its primary analytical tool is scanning probe microscopy (SPM), which provides submolecular views of reactants, products and sometimes intermediates. However, relevant aspects such as subtle chemical changes and structural details remain inaccessible. In addition, direct monitoring of reaction progress in real time by SPM is challenging. This analytical gap is increasingly being filled by complementary analytics: mass spectrometry can be used not only to detect volatile by-products that are released during the reaction, but also to monitor intermediates and higher oligomers. Surface sensitive vibrational spectroscopy, either with electrons or photons, is advantageous for the identification of perceived reaction products, even in cases where the routine approach based on X-ray photoelectron spectroscopy (XPS) is not very promising. X-ray standing wave (XSW) analysis is a less common technique in OSS but well established in surface science, providing experimental access to adsorption heights with picometre accuracy. Its value for detailed comparison and validation of prevailing density functional theory (DFT) based structure calculations cannot be overstated. Recent examples also show the benefits of XSW for less regular structures, such as those often obtained in OSS. Finally, the assessment of reaction kinetics has considerable potential to provide fundamental insights into elementary processes and hidden reaction partners for the unique coupling of larger molecules on surfaces into extended structures. Real-time XPS has sufficient chemical and temporal resolution to monitor reaction kinetics for coupling on surfaces. Ideally, mechanistic insights can be gained by modelling. However, the typically applied linear temperature profiles have limitations that can be overcome by exploring new temperature profiles. Again, the accurate determination of kinetic reaction parameters, such as activation energies, is of paramount importance for benchmarking DFT calculations. Although spectroscopy is already applied for OSS its broader and more systematic implementation appears highly promising for the advancement of the fundamental understanding of OSS, hence eventually also for optimizing the reaction protocols and outcomes.

互补分析在表面合成中的应用。
表面合成(OSS)有助于将固体表面上的大分子偶联成扩展的共价纳米结构,这是湿化学难以或不可能实现的。它的主要分析工具是扫描探针显微镜(SPM),它提供了反应物,产物,有时中间体的亚分子视图。然而,诸如微妙的化学变化和结构细节等相关方面仍然无法了解。此外,通过SPM直接实时监测反应过程具有挑战性。这一分析空白正逐渐被互补分析所填补:质谱法不仅可以用于检测反应过程中释放的挥发性副产物,还可以用于监测中间体和高低聚物。表面敏感振动光谱学,无论是电子还是光子,都有利于识别可感知的反应产物,即使在基于x射线光电子能谱(XPS)的常规方法不是很有前途的情况下。x射线驻波(XSW)分析在OSS中是一种不太常见的技术,但在表面科学中得到了很好的应用,可以提供皮米精度的吸附高度实验。它的价值为详细比较和验证流行的密度泛函理论(DFT)为基础的结构计算不能被夸大。最近的例子也显示了XSW对于不太规则的结构(例如在OSS中经常获得的结构)的好处。最后,反应动力学的评估具有相当大的潜力,可以为表面大分子与扩展结构的独特耦合提供基本过程和隐藏反应伙伴的基本见解。实时XPS具有足够的化学和时间分辨率来监测表面上耦合的反应动力学。理想情况下,可以通过建模来获得机械洞察力。然而,通常应用的线性温度曲线有局限性,可以通过探索新的温度曲线来克服这些局限性。同样,准确确定动力学反应参数,如活化能,对基准DFT计算至关重要。虽然光谱学已经应用于OSS,但其更广泛和更系统的实施对于提高对OSS的基本理解,从而最终优化反应方案和结果,似乎非常有希望。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Nanoscale Horizons
Nanoscale Horizons Materials Science-General Materials Science
CiteScore
16.30
自引率
1.00%
发文量
141
期刊介绍: Nanoscale Horizons stands out as a premier journal for publishing exceptionally high-quality and innovative nanoscience and nanotechnology. The emphasis lies on original research that introduces a new concept or a novel perspective (a conceptual advance), prioritizing this over reporting technological improvements. Nevertheless, outstanding articles showcasing truly groundbreaking developments, including record-breaking performance, may also find a place in the journal. Published work must be of substantial general interest to our broad and diverse readership across the nanoscience and nanotechnology community.
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