A low power noise tolerant wide fan-in OR logic domino gate

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Ankur Kumar , Naman Garg , R.K. Nagaria
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引用次数: 0

Abstract

In this work, a low power noise tolerant domino gate is designed to reduce the leakage current and enhance the noise margin at optimized delay for wide fan-in OR logic. These improvements in the proposed domino gate have made in two phase. In the first phase, an arrangement, in which transmission gate along with static inverter, is designed to control the conduction of keeper transistor so that dynamic power and noise margin can be reduced and improved simultaneously. In second phase, two transistors having low threshold voltage in the evaluation network are inserted to decrease the subthreshold leakage current at optimized delay. Further, 256-bit wide multiplexer has been designed using the proposed domino gate to test the efficiency over the conventional domino. Thus, it is concluded that proposed domino is capable to design modern superscalar microprocessor, register file and other wide fan-in low power VLSI circuits. According to the simulation results, this work demonstrates a power consumption decrease of 20 % and 12 % as well as a noise margin improvement of 58 % and 25 % when compared with conventional domino and high speed domino, respectively. The cadence virtuoso EDA tool is used to evaluate and obtain the performance parameters of the designed gate along with existing work for 45 nm CMOS technology.
低功耗容噪宽扇入或逻辑多米诺门
本文设计了一种低功耗容噪多米诺门电路,用于宽扇入或逻辑在优化延迟下降低泄漏电流并提高噪声裕度。所提议的多米诺骨牌门的这些改进分为两个阶段。在第一阶段,设计传输栅极与静态逆变器一起控制保持管导通的布置,从而同时降低和提高动态功率和噪声余量。在第二阶段,在评估网络中插入两个具有低阈值电压的晶体管,以降低优化延迟下的亚阈值泄漏电流。此外,利用所提出的多米诺门设计了256位宽的多路复用器,以测试其优于传统多米诺门的效率。由此得出结论,所提出的多米诺能够设计现代超标量微处理器、寄存器文件和其他宽风扇内低功耗VLSI电路。仿真结果表明,与传统多米诺骨牌和高速多米诺骨牌相比,该方法的功耗分别降低了20%和12%,噪声裕度分别提高了58%和25%。利用cadence virtuoso EDA工具,结合现有的45纳米CMOS技术工作,对所设计栅极的性能参数进行了评估和获取。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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