Samuel M. Linser , Shivashankar R. Vangala , Harris J. Hall , Duane Brinegar , Timothy A. Prusnick , Vladimir L. Tassev
{"title":"Surface mechanics of GaAsP/GaAs epilayers for non-linear optical devices","authors":"Samuel M. Linser , Shivashankar R. Vangala , Harris J. Hall , Duane Brinegar , Timothy A. Prusnick , Vladimir L. Tassev","doi":"10.1016/j.omx.2025.100420","DOIUrl":null,"url":null,"abstract":"<div><div>We report on nanoindentation measurements of hydride vapor phase epitaxy (HVPE) grown Gallium Arsenide Phosphide (GaAs<sub>1-x</sub>P<sub>x</sub>) epilayers, of interest for generation of mid-infrared wavelengths via frequency conversion. Our results indicate a linear trend in Young's modulus with increasing phosphorus content (P-content), in keeping with Vegard's Law for ternary compounds. The corresponding data for hardness demonstrate significant bowing with a peak of 10.7 GPa occurring at 78 % P-content. Some epilayers exhibit non-negligible spatial variation in their mechanical properties, which is investigated with complementary measurements. Photoluminescence measurements indicate high composition uniformity, while atomic force microscopy reveals a direct correlation between surface roughness and mechanical variability. Preliminary laser-induced damage threshold (LIDT) results are reported, and the implications for material optimization are discussed. With a 1070-nm continuous wave laser, GaAs<sub>0.75</sub>P<sub>0.25</sub> and GaAs<sub>0.52</sub>P<sub>0.48</sub> epilayers demonstrated LID thresholds of 600 kW/cm<sup>2</sup> and 300 kW/cm<sup>2</sup>, respectively.</div></div>","PeriodicalId":52192,"journal":{"name":"Optical Materials: X","volume":"27 ","pages":"Article 100420"},"PeriodicalIF":0.0000,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Materials: X","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2590147825000221","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
We report on nanoindentation measurements of hydride vapor phase epitaxy (HVPE) grown Gallium Arsenide Phosphide (GaAs1-xPx) epilayers, of interest for generation of mid-infrared wavelengths via frequency conversion. Our results indicate a linear trend in Young's modulus with increasing phosphorus content (P-content), in keeping with Vegard's Law for ternary compounds. The corresponding data for hardness demonstrate significant bowing with a peak of 10.7 GPa occurring at 78 % P-content. Some epilayers exhibit non-negligible spatial variation in their mechanical properties, which is investigated with complementary measurements. Photoluminescence measurements indicate high composition uniformity, while atomic force microscopy reveals a direct correlation between surface roughness and mechanical variability. Preliminary laser-induced damage threshold (LIDT) results are reported, and the implications for material optimization are discussed. With a 1070-nm continuous wave laser, GaAs0.75P0.25 and GaAs0.52P0.48 epilayers demonstrated LID thresholds of 600 kW/cm2 and 300 kW/cm2, respectively.