Compositional Community Detection: Automated Identification of Chemical Segregation in Atom Probe Tomography Data.

IF 3 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Jenna A Bilbrey, Christina Doty, Mark G Wirth, Mengkong Tong, Jacqueline Royer, David J Senor, Arun Devaraj
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引用次数: 0

Abstract

We introduce a fully unsupervised clustering method we call Compositional Community Detection (CCD) to identify chemical motifs in atom probe tomography (APT) reconstructions. In the CCD approach, APT point clouds are broken into overlapping spherical neighborhoods, and repeated k-means clustering coupled with Louvain community detection is used to group neighborhoods based on their ion composition. Kolmogorov-Smirnov statistics for present ion types provide interpretable descriptors of each community that indicate the relative level of enrichment or depletion of ions within a community. We demonstrate our technique on a set of APT reconstructions of irradiated 316 stainless steel. Our method detected chromium carbide and Ni-Si-rich precipitates and located a grain boundary based on Ni and Si enrichment. Spatial correlations between communities indicated that chromium carbide precipitates were flanked by regions of Fe depletion. Our results highlight the potential of CCD in the analysis of chemical segregation in broader classes of materials, in terms of both varying synthesis methods and exposure to extreme environments.

成分群落检测:原子探针层析成像数据中化学分离的自动识别。
我们引入了一种完全无监督的聚类方法,我们称之为成分群落检测(CCD)来识别原子探针断层扫描(APT)重建中的化学基序。在CCD方法中,APT点云被分解成重叠的球形邻域,并使用重复k-means聚类结合Louvain社区检测,根据它们的离子组成对邻域进行分组。当前离子类型的Kolmogorov-Smirnov统计提供了每个群落的可解释描述符,表明群落内离子的富集或耗尽的相对水平。我们在一组辐照316不锈钢的APT重建上展示了我们的技术。我们的方法检测了碳化铬和富Ni-Si的析出物,并根据Ni和Si的富集定位了晶界。群落间的空间相关性表明,碳化铬析出相的两侧为缺铁区。我们的研究结果突出了CCD在分析更广泛的材料类别中的化学分离方面的潜力,无论是不同的合成方法还是暴露于极端环境。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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