Jenna A Bilbrey, Christina Doty, Mark G Wirth, Mengkong Tong, Jacqueline Royer, David J Senor, Arun Devaraj
{"title":"Compositional Community Detection: Automated Identification of Chemical Segregation in Atom Probe Tomography Data.","authors":"Jenna A Bilbrey, Christina Doty, Mark G Wirth, Mengkong Tong, Jacqueline Royer, David J Senor, Arun Devaraj","doi":"10.1093/mam/ozaf036","DOIUrl":null,"url":null,"abstract":"<p><p>We introduce a fully unsupervised clustering method we call Compositional Community Detection (CCD) to identify chemical motifs in atom probe tomography (APT) reconstructions. In the CCD approach, APT point clouds are broken into overlapping spherical neighborhoods, and repeated k-means clustering coupled with Louvain community detection is used to group neighborhoods based on their ion composition. Kolmogorov-Smirnov statistics for present ion types provide interpretable descriptors of each community that indicate the relative level of enrichment or depletion of ions within a community. We demonstrate our technique on a set of APT reconstructions of irradiated 316 stainless steel. Our method detected chromium carbide and Ni-Si-rich precipitates and located a grain boundary based on Ni and Si enrichment. Spatial correlations between communities indicated that chromium carbide precipitates were flanked by regions of Fe depletion. Our results highlight the potential of CCD in the analysis of chemical segregation in broader classes of materials, in terms of both varying synthesis methods and exposure to extreme environments.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":"31 3","pages":""},"PeriodicalIF":3.0000,"publicationDate":"2025-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy and Microanalysis","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/mam/ozaf036","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
We introduce a fully unsupervised clustering method we call Compositional Community Detection (CCD) to identify chemical motifs in atom probe tomography (APT) reconstructions. In the CCD approach, APT point clouds are broken into overlapping spherical neighborhoods, and repeated k-means clustering coupled with Louvain community detection is used to group neighborhoods based on their ion composition. Kolmogorov-Smirnov statistics for present ion types provide interpretable descriptors of each community that indicate the relative level of enrichment or depletion of ions within a community. We demonstrate our technique on a set of APT reconstructions of irradiated 316 stainless steel. Our method detected chromium carbide and Ni-Si-rich precipitates and located a grain boundary based on Ni and Si enrichment. Spatial correlations between communities indicated that chromium carbide precipitates were flanked by regions of Fe depletion. Our results highlight the potential of CCD in the analysis of chemical segregation in broader classes of materials, in terms of both varying synthesis methods and exposure to extreme environments.
期刊介绍:
Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.