Junhao Chen , Chenhong Huang , Tiecheng Luo , Yujia Tu , Xifu Chen , Zhuo Yang , Hongtai Luo , Gang Wang , Xing Lu , Zimin Chen
{"title":"Isotropic performance of surface acoustic wave resonators based on ε-Ga2O3(001) thin films","authors":"Junhao Chen , Chenhong Huang , Tiecheng Luo , Yujia Tu , Xifu Chen , Zhuo Yang , Hongtai Luo , Gang Wang , Xing Lu , Zimin Chen","doi":"10.1016/j.apsusc.2025.163959","DOIUrl":null,"url":null,"abstract":"<div><div>Epsilon-phase gallium oxide (ε-Ga<sub>2</sub>O<sub>3</sub>) thin film is an emerging piezoelectric semiconductor for the application in RF resonators. Compared with traditional thin films such as AlN (d<sub>33</sub>≈5 pm/V), ε-Ga<sub>2</sub>O<sub>3</sub> possesses a high piezoelectric coefficient (d<sub>33</sub>≈11 pm/V). As a material belonging to the orthorhombic crystal system, ε-Ga<sub>2</sub>O<sub>3</sub> is theoretically expected to exhibit anisotropic properties on the (001) plane. However, in this study, a comprehensive investigation on the angular dependence of surface acoustic wave (SAW) propagation properties reveals that the ε-Ga<sub>2</sub>O<sub>3</sub>(001) plane is actually highly isotropic. Measurements of electrostatic, mechanical, and thermomechanical characteristics along different in-plane directions on ε-Ga<sub>2</sub>O<sub>3</sub>(001) present standard deviation smaller than 3 %. The dielectric constant of ε-Ga<sub>2</sub>O<sub>3</sub> is extracted to be 11.7 ± 0.1 by the capacitance measurement. Phase velocity and the temperature coefficient of frequency (TCF) for ε-Ga<sub>2</sub>O<sub>3</sub> SAW resonators are determined to be 3169 ± 4 m/s and −58.9 ± 1.7 ppm/°C for Rayleigh mode, while it is 5319 ± 11 m/s and −58.9 ± 1.2 ppm/°C for Sezawa mode. The abnormal isotropy of the orthorhombic ε-Ga<sub>2</sub>O<sub>3</sub> is explained by the existence of triple rotational domains. The results provide critical basic parameters for the future development and application in ε-Ga<sub>2</sub>O<sub>3</sub>-based SAW devices.</div></div>","PeriodicalId":247,"journal":{"name":"Applied Surface Science","volume":"710 ","pages":"Article 163959"},"PeriodicalIF":6.3000,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Surface Science","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0169433225016745","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
Abstract
Epsilon-phase gallium oxide (ε-Ga2O3) thin film is an emerging piezoelectric semiconductor for the application in RF resonators. Compared with traditional thin films such as AlN (d33≈5 pm/V), ε-Ga2O3 possesses a high piezoelectric coefficient (d33≈11 pm/V). As a material belonging to the orthorhombic crystal system, ε-Ga2O3 is theoretically expected to exhibit anisotropic properties on the (001) plane. However, in this study, a comprehensive investigation on the angular dependence of surface acoustic wave (SAW) propagation properties reveals that the ε-Ga2O3(001) plane is actually highly isotropic. Measurements of electrostatic, mechanical, and thermomechanical characteristics along different in-plane directions on ε-Ga2O3(001) present standard deviation smaller than 3 %. The dielectric constant of ε-Ga2O3 is extracted to be 11.7 ± 0.1 by the capacitance measurement. Phase velocity and the temperature coefficient of frequency (TCF) for ε-Ga2O3 SAW resonators are determined to be 3169 ± 4 m/s and −58.9 ± 1.7 ppm/°C for Rayleigh mode, while it is 5319 ± 11 m/s and −58.9 ± 1.2 ppm/°C for Sezawa mode. The abnormal isotropy of the orthorhombic ε-Ga2O3 is explained by the existence of triple rotational domains. The results provide critical basic parameters for the future development and application in ε-Ga2O3-based SAW devices.
期刊介绍:
Applied Surface Science covers topics contributing to a better understanding of surfaces, interfaces, nanostructures and their applications. The journal is concerned with scientific research on the atomic and molecular level of material properties determined with specific surface analytical techniques and/or computational methods, as well as the processing of such structures.