Maximization of near-infrared modulation by optimizing the transparent conducting–electrode resistance

IF 1.3 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Jisu Han, Sang Kyu Lee, Juhyun Park, Jugyeong Lee, Chil Seong Ah, Tae-Youb Kim
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引用次数: 0

Abstract

Traditional camouflage focuses on visual concealment, but the growing use of infrared (IR) detection systems has created a need for materials that can manipulate IR wavelengths. Electrochromic devices—commonly used for light and heat control—offer a promising solution for dynamic IR control. These systems rely on transparent conducting electrodes, with indium tin oxide (ITO) being the most common. However, ITO presents a challenge, as it generally blocks IR light transmissions. In this study, we optimize for IR transmissions by adjusting the ITO thickness, demonstrating excellent modulation in electrochromic devices. Devices with ITO thicknesses of 40 nm, 75 nm, and 302 nm are tested, with the 75-nm electrode achieving 67.73% transmittance modulation in the visible range and 51.41% in the near-infrared range. Response times for bleaching and coloration are 4.0 s and 2.8 s, respectively.

Abstract Image

通过优化透明导电电极电阻实现近红外调制的最大化
传统的迷彩侧重于视觉隐藏,但红外探测系统的日益广泛使用产生了对能够操纵红外波长的材料的需求。电致变色装置-通常用于光和热控制-为动态红外控制提供了一个有前途的解决方案。这些系统依赖于透明导电电极,氧化铟锡(ITO)是最常见的。然而,ITO提出了一个挑战,因为它通常会阻挡红外光传输。在本研究中,我们通过调整ITO厚度来优化红外传输,展示了电致变色器件的出色调制。测试了ITO厚度为40 nm、75 nm和302 nm的器件,其中75 nm电极在可见光范围内实现了67.73%的透过率调制,在近红外范围内实现了51.41%的透过率调制。漂白和着色的反应时间分别为4.0秒和2.8秒。
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来源期刊
ETRI Journal
ETRI Journal 工程技术-电信学
CiteScore
4.00
自引率
7.10%
发文量
98
审稿时长
6.9 months
期刊介绍: ETRI Journal is an international, peer-reviewed multidisciplinary journal published bimonthly in English. The main focus of the journal is to provide an open forum to exchange innovative ideas and technology in the fields of information, telecommunications, and electronics. Key topics of interest include high-performance computing, big data analytics, cloud computing, multimedia technology, communication networks and services, wireless communications and mobile computing, material and component technology, as well as security. With an international editorial committee and experts from around the world as reviewers, ETRI Journal publishes high-quality research papers on the latest and best developments from the global community.
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