Rapid Mueller Matrix Holographic Microscopy Imaging for Polarization Sensitive Materials

IF 5.9 2区工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Instrumentation and Measurement Pub Date : 2025-06-19 DOI:10.1109/TIM.2025.3580876

Xintian Yu;Lei Liu;Zhi Zhong;Lei Yu;Qing Dong;Bei Lu;Nan Li;Mingguang Shan

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引用次数: 0

Abstract

Mueller matrix polarimetry (MMP) is a powerful technique employed in various fields, such as biomedical optics, material science, and remote sensing. However, existing MMP techniques typically require multiple exposures (12 or more), which compromises measurement efficiency and increases susceptibility to errors. In this study, a rapid Mueller matrix holographic microscopy (RMHM) was proposed for extracting the complete

$4\times 4$

Mueller matrix (MM) of polarization-sensitive materials. Based on an off-axis digital holography (DH) interferometer, the geometric phase is determined to reconstruct the MM using the Pancharatnam-Berry (PB) phase theory and a division algorithm. Our method retains the advantages of existing DH techniques, requiring only three acquisitions to capture the complete MM. The proposal is validated through the application of a rotating quarter-wave plate (QWP), followed by the measurement of polarization parameters including circular and linear retardance, depolarization, and the birefringent fast-axis angle. The analysis covers various materials, such as plant roots, potato starch granules, and pathological lung cancer tissues.

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偏振敏感材料的快速穆勒矩阵全息显微成像

米勒矩阵偏振法（MMP）是一种应用于生物医学光学、材料科学和遥感等各个领域的强大技术。然而，现有的MMP技术通常需要多次曝光（12次或更多），这降低了测量效率并增加了对误差的敏感性。本文提出了一种快速Mueller矩阵全息显微镜（RMHM），用于提取极化敏感材料的完整的$4\ × 4$ Mueller矩阵（MM）。基于离轴数字全息（DH）干涉仪，利用Pancharatnam-Berry （PB）相位理论和除法算法确定几何相位重构MM。我们的方法保留了现有DH技术的优点，只需要三次采集就可以捕获完整的MM。通过旋转四分之一波片（QWP）的应用验证了该建议，随后测量了偏振参数，包括圆和线延迟、去偏振和双折射快轴角。该分析涵盖了各种材料，如植物根，马铃薯淀粉颗粒，病理肺癌组织。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Instrumentation and Measurement 工程技术-工程：电子与电气

CiteScore

9.00

自引率

23.20%

发文量

1294

审稿时长

3.9 months

期刊介绍： Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.