Tomoya Horide, Shin Okumura, Shunta Ito, Yutaka Yoshida
{"title":"Integrated process-property modeling of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub> superconducting film for data and model driven process design.","authors":"Tomoya Horide, Shin Okumura, Shunta Ito, Yutaka Yoshida","doi":"10.1038/s44172-025-00434-1","DOIUrl":null,"url":null,"abstract":"<p><p>Process engineering of materials determines not only materials properties, but also cost, yield and production capacity. Although process design is generally based on the experience of process engineers, mathematical/data-science modeling is a key challenge for future process optimization. Here we create new opportunities for process optimization in YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub> film fabrication through data/model-driven process design. We show integrated modelling of substrate temperature and critical current density in YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub> films. Gaussian process regression augmented by transfer learning and physics knowledge was constructed from a small amount of data to show substrate temperature dependence of critical current density. Non-numerical factors such as chamber design and substrate material were included in the transfer learning, and physics-aided techniques extended the model to different magnetic fields. Magnetic field dependence of critical current density was successfully predicted for a given substrate temperature for a five-sample series deposited using different pulsed laser deposition systems. Our integrated process and property modelling strategy enables data/model-driven process design for YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub> film fabrication for coated conductor applications.</p>","PeriodicalId":72644,"journal":{"name":"Communications engineering","volume":"4 1","pages":"114"},"PeriodicalIF":0.0000,"publicationDate":"2025-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Communications engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1038/s44172-025-00434-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Process engineering of materials determines not only materials properties, but also cost, yield and production capacity. Although process design is generally based on the experience of process engineers, mathematical/data-science modeling is a key challenge for future process optimization. Here we create new opportunities for process optimization in YBa2Cu3O7 film fabrication through data/model-driven process design. We show integrated modelling of substrate temperature and critical current density in YBa2Cu3O7 films. Gaussian process regression augmented by transfer learning and physics knowledge was constructed from a small amount of data to show substrate temperature dependence of critical current density. Non-numerical factors such as chamber design and substrate material were included in the transfer learning, and physics-aided techniques extended the model to different magnetic fields. Magnetic field dependence of critical current density was successfully predicted for a given substrate temperature for a five-sample series deposited using different pulsed laser deposition systems. Our integrated process and property modelling strategy enables data/model-driven process design for YBa2Cu3O7 film fabrication for coated conductor applications.