Assessing the near-surface diffusion of Xe and Kr in Zirconia by time-of-flight elastic recoil detection analysis

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION
N. Wikström , M. Giamouridou , E. Charatsidou , P. Olsson , J. Oscarsson , D. Primetzhofer , R.J.W. Frost
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引用次数: 0

Abstract

The diffusion of two volatile fission products, xenon (Xe) and krypton (Kr), in zirconia (ZrO2) is investigated. Samples of Yttria (Y2O3)-stabilised tetragonal ZrO2 were implanted with either Xe or Kr, at 300 keV, with a fluence of 1017 at./cm2, and subsequently analysed with time-of-flight elastic recoil detection analysis (ToF-ERDA) to obtain elemental composition depth profiles. Samples were then annealed at 1200 °C for 9 h, and the effect of the annealing was assessed by ToF-ERDA measurements. From these measurements, first-order approximations of diffusion coefficients for Xe and Kr in ZrO2 were derived, using a model based on Fick’s second law, these being (1.36±0.87)×1019 m2/s and (2.94±1.96)×1019 m2/s at 1200 °C for Kr and Xe respectively. It was shown that ToF-ERDA can provide data to analyse the diffusion of elements in solid sample matrices and that a model based on Fick’s Law can predict the diffusion of the implanted ions.
利用飞行时间弹性反冲检测分析评估Xe和Kr在氧化锆中的近表面扩散
研究了两种挥发性裂变产物氙(Xe)和氪(Kr)在氧化锆(ZrO2)中的扩散。钇(Y2O3)稳定的方形ZrO2样品在300 keV下注入Xe或Kr,影响为1017 at。/cm2,随后使用飞行时间弹性后坐力检测分析(ToF-ERDA)进行分析,获得元素组成深度剖面。然后将样品在1200°C下退火9 h,并通过ToF-ERDA测量评估退火的效果。根据这些测量结果,利用基于菲克第二定律的模型,推导出了ZrO2中Xe和Kr的一阶近似扩散系数,分别为(1.36±0.87)×10−19 m2/s和(2.94±1.96)×10−19 m2/s。结果表明,ToF-ERDA可以为分析元素在固体样品基质中的扩散提供数据,基于菲克定律的模型可以预测注入离子的扩散。
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来源期刊
CiteScore
2.80
自引率
7.70%
发文量
231
审稿时长
1.9 months
期刊介绍: Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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