Study of surfaces of insulating materials by near-edge X-ray absorption fine structure spectroscopy in total-electron-yield mode

IF 1.4 3区物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2025-06-24 DOI:10.1016/j.nimb.2025.165779

Eiichi Kobayashi , Osamu Takahashi , Kyoko K. Bando , Koji K. Okudaira , Satoru Yoshioka

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Abstract

We analyzed the surfaces of insulating materials using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy in total-electron-yield (TEY) mode. Conventionally, insulating materials such as glass and ceramics prepared for NEXAFS analysis by the TEY method are ground and fixed in a sample holder to avoid charging. However, this method is not suitable for analysis of chemically treated surfaces because of surface contamination and changes in the chemical state or structure of the sample. Therefore, by placing a gold mesh on the sample surface, we obtained a normal spectrum without surface contamination and without the effects of charge-up. A comparison with theoretical calculations revealed that OH groups are mainly adsorbed onto the insulator surface exposed to the atmosphere.

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全电子产额模式下近边x射线吸收精细结构光谱研究绝缘材料表面

利用近边x射线吸收精细结构（NEXAFS）光谱在全电子产额（TEY）模式下分析了绝缘材料的表面。通常，通过TEY方法为NEXAFS分析制备的玻璃和陶瓷等绝缘材料被磨碎并固定在样品支架中以避免充电。然而，由于表面污染和样品化学状态或结构的变化，这种方法不适合分析化学处理过的表面。因此，通过在样品表面放置金网，我们获得了没有表面污染和没有充电影响的正常光谱。与理论计算的比较表明，羟基主要吸附在暴露于大气中的绝缘体表面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms 物理-核科学技术

CiteScore

2.80

自引率

7.70%

发文量

231

审稿时长

1.9 months

期刊介绍： Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.