Chanyoung Lee , Yeonkyu Lee , Jinyoung Yun , J.C. Zapata , S. Suárez , M. Sirena , Jeehoon Kim , N. Haberkorn
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引用次数: 0
Abstract
We report on the superconducting properties of 40 nm thick C-doped aluminum (Al-C) thin films grown by co-sputtering on silicon substrates at room temperature. The films were fabricated by fixing the Al target power at 80 W and varying the C target power between 4 and 50 W. Carbon incorporation modifies the transport properties, decreasing the residual-resistivity ratio from ∼ 1.5 to ∼ 1.1 and moderately increasing the normal-state resistivity. For C powers above 12 W, Tc increases systematically, reaching 2.35 K without saturation. Measurements of the upper critical field reveal moderate values, with zero-temperature extrapolations of 0.09 T and 0.15 T for samples grown at 40 W and 50 W, respectively. Unlike the typical behavior observed with oxygen or nitrogen doping, the Al-C films exhibit a significant Tc enhancement without a substantial increase in normal-state resistivity.
期刊介绍:
Materials Letters has an open access mirror journal Materials Letters: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
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