Atomic Force Microscopy for Cross-Disciplinary Materials Research.

Abstract

While microscopy remains the primary method for verifying material structures, recent technological advancements have both enabled and necessitated the analysis of ever-finer details. Unlike scanning electron microscopy (SEM) and transmission electron microscopy (TEM), atomic force microscopy (AFM) provides unique capabilities beyond visualization, mapping surface properties through precisely controlled physical interactions between the probe and sample. In materials research specifically, AFM has become indispensable for characterizing mechanical, electrical, chemical, and magnetic properties at the nanoscale with exceptional spatial resolution. With ongoing technological progress and the expansion of specialized imaging modes, AFM enables cross-disciplinary collaboration across various materials science domains, from electronic materials to energy storage systems. However, its effective implementation is often challenged by the technical complexity and varied domain expertise among collaborators. This review examines critical considerations in AFM-based research, from experimental protocols to quantitative data analysis. Validated approaches for measurement optimization are presented to ensure reproducibility and support successful cross-disciplinary AFM implementation. The review includes detailed implementation guidance for advanced AFM methodologies and comprehensive case studies spanning diverse material systems. By providing theoretical foundations and practical guidance, this review aims to facilitate more effective collaboration across disciplines, ultimately advancing the use of AFM in complex, multi-faceted research.