Unmixing system-wide and geometry-specific plasmon modes in faceted nanoparticle trimers using a two-step matrix factorization

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Martin Couillard
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引用次数: 0

Abstract

Plasmonic modes in coupled nanoparticle systems are shaped by both interparticle interactions and geometry-specific features, such as facets and vertices. However, standard decomposition techniques, such as non-negative matrix factorization (NMF), often fail to individually isolate modes that are localized. This limitation arises because the factorization process relies solely on spectral data, without incorporating spatial context. To address this, we apply factorization in two steps. First, NMF identifies bulk and coupled system-wide contributions, that can then be removed in spectral reconstruction to isolate localized geometry-specific modes. Then, we perform region-based NMF on spatially-selected areas of a silica-shelled silver-nanoparticle trimer to identify subtle energy shifts between vertex and facet modes at different locations on the nanoparticles. Our approach thus enables the identification of global plasmonic modes extending across the entire dimer or trimer system, as well as geometry-specific modes arising from the faceted structure of individual nanoparticles. By reintroducing spatial context, we further distinguish between different localized modes, even within the same nanoparticle, revealing the influence of subtle geometric variations on plasmonic resonances and the potential for partial coupling between geometry-specific modes.
使用两步矩阵分解在多面纳米粒子三聚体中分离系统范围和几何特定的等离子体模式
耦合纳米粒子系统中的等离子体模式由粒子间相互作用和几何特定特征(如切面和顶点)共同塑造。然而,标准分解技术,如非负矩阵分解(NMF),往往不能单独分离出局部模式。这种限制是因为分解过程仅仅依赖于光谱数据,而不考虑空间背景。为了解决这个问题,我们分两步应用分解。首先,NMF识别整体和耦合系统范围的贡献,然后可以在光谱重建中去除这些贡献,以隔离局部几何特定模式。然后,我们对硅壳银纳米颗粒三聚体的空间选择区域进行基于区域的NMF,以识别纳米颗粒上不同位置顶点模式和面模式之间的细微能量转移。因此,我们的方法能够识别跨越整个二聚体或三聚体体系的整体等离子体模式,以及由单个纳米颗粒的多面结构产生的几何特定模式。通过重新引入空间背景,我们进一步区分了不同的局域模式,甚至在同一纳米颗粒内,揭示了细微的几何变化对等离子体共振的影响以及几何特定模式之间部分耦合的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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