Advancing atomic electron tomography with neural networks.

Q3 Immunology and Microbiology
Juhyeok Lee, Yongsoo Yang
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引用次数: 0

Abstract

Accurate determination of three-dimensional (3D) atomic structures is crucial for understanding and controlling the properties of nanomaterials. Atomic electron tomography (AET) offers non-destructive atomic imaging with picometer-level precision, enabling the resolution of defects, interfaces, and strain fields in 3D, as well as the observation of dynamic structural evolution. However, reconstruction artifacts arising from geometric limitations and electron dose constraints can hinder reliable atomic structure determination. Recent progress has integrated deep learning, especially convolutional neural networks, into AET workflows to improve reconstruction fidelity. This review highlights recent advances in neural network-assisted AET, emphasizing its role in overcoming persistent challenges in 3D atomic imaging. By significantly enhancing the accuracy of both surface and bulk structural characterization, these methods are advancing the frontiers of nanoscience and enabling new opportunities in materials research and technology.

利用神经网络推进原子电子断层扫描。
准确测定纳米材料的三维原子结构对于理解和控制纳米材料的性质至关重要。原子电子断层扫描(AET)提供了皮米级精度的非破坏性原子成像,能够在3D中分辨缺陷、界面和应变场,以及观察动态结构演变。然而,由几何限制和电子剂量限制引起的重建伪影会阻碍可靠的原子结构测定。最近的进展是将深度学习,特别是卷积神经网络集成到AET工作流程中,以提高重建保真度。本文综述了神经网络辅助AET的最新进展,强调了其在克服三维原子成像持续挑战中的作用。通过显著提高表面和体结构表征的准确性,这些方法正在推进纳米科学的前沿,并为材料研究和技术提供新的机会。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Applied Microscopy
Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍: Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.
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