Zhi Chai , Jian Hu , Yingxue Liu , Mingye Li , Xinran Huang , Weisheng Hu , Xuelin Yang
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引用次数: 0
Abstract
For the physical-layer security enhancement in optical networks, hardware fingerprint authentication (HFA) is proposed by identifying subtle inherent impairments of different optical transmitters in the received signals using neural networks (NNs). However, due to NN’s black-box nature, HFA may be susceptible to adversarial attacks, which is often overlooked in related research, but can lead to HFA erroneously granting high-level permissions to attackers. In this paper, we experimentally demonstrate that classical attacks against NNs, such as projected gradient descent (PGD), are also effective against HFA in optical networks, achieving an average targeted attack success rate of 66.43%. Furthermore, we propose an NN-based white-box attack framework named attack neural network (ATKNN) and a conditional generative adversarial network (CGAN)-based black-box attack framework named attack generator (ATKG). Both ATKNN and ATKG achieve a much higher success rate of ∼ 100%, while their perturbations on the signals are significantly smaller and smoother, making the attacks more elusive. Our work reveals the shortcomings of the mainstream HFA frameworks and lays the foundation for HFA’s future improvements.
期刊介绍:
Innovations in optical fiber technology are revolutionizing world communications. Newly developed fiber amplifiers allow for direct transmission of high-speed signals over transcontinental distances without the need for electronic regeneration. Optical fibers find new applications in data processing. The impact of fiber materials, devices, and systems on communications in the coming decades will create an abundance of primary literature and the need for up-to-date reviews.
Optical Fiber Technology: Materials, Devices, and Systems is a new cutting-edge journal designed to fill a need in this rapidly evolving field for speedy publication of regular length papers. Both theoretical and experimental papers on fiber materials, devices, and system performance evaluation and measurements are eligible, with emphasis on practical applications.