Knowledge-Based Extrapolation of Neural Network Model for Transistor Modeling

IF 3.4 0 ENGINEERING, ELECTRICAL & ELECTRONIC
Jinyuan Cui;Lei Zhang;Humayun Kabir;Zhihao Zhao;Rick Sweeney;Qi-Jun Zhang
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引用次数: 0

Abstract

Artificial neural network (ANN) is a useful technique for active device modeling. However, it shows limitations in the extrapolation region. To address this issue, we propose a novel knowledge-based neural network (KBNN) method. The KBNN technique consists of three submodels and their transition mechanisms. One submodel is a pure ANN model which is used for training data region. Two additional submodels are used for the extrapolation region. The proposed method ensures that the output and derivatives of ANN and extrapolation models match at the boundary of the measurement data. This keeps the KBNN model smooth and consistent, making it suitable for transistor design over a broad range. The precision, smoothness, and consistency of the proposed method are verified with a $2\times 250~\mu $ m GaN HEMT device modeling. The results show that the KBNN model provides physically reasonable predictions over a wide extrapolation region.
晶体管建模中基于知识的神经网络模型外推
人工神经网络(ANN)是一种有效的有源器件建模技术。然而,它在外推区域显示出局限性。为了解决这个问题,我们提出了一种新的基于知识的神经网络(KBNN)方法。KBNN技术包括三个子模型及其转换机制。其中一个子模型是纯人工神经网络模型,用于训练数据区域。外推区域使用了另外两个子模型。该方法保证了人工神经网络和外推模型的输出和导数在测量数据的边界处匹配。这使KBNN模型保持平滑和一致,使其适用于广泛范围的晶体管设计。通过2 × 250 μ m GaN HEMT器件的建模,验证了该方法的精度、平滑性和一致性。结果表明,KBNN模型在广泛的外推范围内提供了物理上合理的预测。
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