{"title":"A 4–420-GHz Distributed Amplifier MMIC in a 20-nm InGaAs-on-Si HEMT Technology With 11 ± 2 dB Gain","authors":"Fabian Thome;Arnulf Leuther","doi":"10.1109/LMWT.2025.3551639","DOIUrl":null,"url":null,"abstract":"This letter presents a distributed amplifier (DA) monolithic microwave integrated circuit (MMIC) achieving a bandwidth (BW) of 4–420 GHz with a small-signal gain of 11 ± 2 dB. This sets a new BW record for ultrawideband amplifier MMICs. DA MMIC utilizes the Fraunhofer IAF 20-nm gatelength InGaAs-on-Si high-electron-mobility transistor (HEMT) technology and features ten gain cells. Each cell contains an RF cascode using two-finger transistors with a total gate width (TGW) of 16 μm. The measured noise figure (NF) is in the range of 3.2–7.7 dB (<202 GHz) and 2.8–6.7 dB when biased for lownoise (LN) conditions. Especially, the high-frequency NF shows a remarkable performance, e.g., achieving an average NF of 4.7 and 5 dB (163–202 GHz) for LN and standard bias, respectively.","PeriodicalId":73297,"journal":{"name":"IEEE microwave and wireless technology letters","volume":"35 6","pages":"844-847"},"PeriodicalIF":0.0000,"publicationDate":"2025-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10941702","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE microwave and wireless technology letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10941702/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This letter presents a distributed amplifier (DA) monolithic microwave integrated circuit (MMIC) achieving a bandwidth (BW) of 4–420 GHz with a small-signal gain of 11 ± 2 dB. This sets a new BW record for ultrawideband amplifier MMICs. DA MMIC utilizes the Fraunhofer IAF 20-nm gatelength InGaAs-on-Si high-electron-mobility transistor (HEMT) technology and features ten gain cells. Each cell contains an RF cascode using two-finger transistors with a total gate width (TGW) of 16 μm. The measured noise figure (NF) is in the range of 3.2–7.7 dB (<202 GHz) and 2.8–6.7 dB when biased for lownoise (LN) conditions. Especially, the high-frequency NF shows a remarkable performance, e.g., achieving an average NF of 4.7 and 5 dB (163–202 GHz) for LN and standard bias, respectively.