Daniel Pechgraber , Ernst Csencsics , Georg Schitter
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引用次数: 0
Abstract
This paper presents the mechatronic design and control of a 3 degree-of-freedom (3-DoF) precision positioning system for high-precise optical 3D inline-metrology based on a dual-stage approach. It overcomes limitations of common optical 3D measurement systems due to motion blur by precisely positioning measurement systems on a metrology platform with respect to a (moving) measurement sample and additionally extends their measurement range. A comprehensive mathematical model of the system is derived and simplified to linear models suitable for classical linear control design methods. Using a modal analysis approach for system decoupling, a decentralized control scheme with individual Single-Input Single-Output controllers is developed for precisely controlling the metrology platform position in 3 DoFs. Experimental measurements on the prototype system demonstrate a maximum measurement error resulting from the positioning system of down to to (rms) during platform motion of up to 100 mm/s over a large inspection area (0.7 m × 0.5 m), as well as 147 nm (rms) error during static positioning.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.