{"title":"Corrections to “Periodic Nonuniform Sampling for Enhanced Recognition of Spread Spectrum Clocking-Based Electromagnetic Signature”","authors":"Euibum Lee;Dong-Hoon Choi;Taesik Nam;Jong-Gwan Yook","doi":"10.1109/TEMC.2025.3556536","DOIUrl":null,"url":null,"abstract":"The above article [1] omitted a crucial step: A phase unwrapping process for $\\angle {{s}_{D.\\text{mea}}}[ n ]$ to prevent unnecessary spikes in its derivative, $d\\{ {\\angle {{s}_{D.\\text{mea}}}[ n ]} \\}/dn$, as given in (12a), (13a), and (14) and plots on Fig. 5. Additionally, the y-axis of the upper plot in Fig. 5 represents phase difference, not the phase.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"1031-1031"},"PeriodicalIF":2.5000,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11036575","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11036575/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The above article [1] omitted a crucial step: A phase unwrapping process for $\angle {{s}_{D.\text{mea}}}[ n ]$ to prevent unnecessary spikes in its derivative, $d\{ {\angle {{s}_{D.\text{mea}}}[ n ]} \}/dn$, as given in (12a), (13a), and (14) and plots on Fig. 5. Additionally, the y-axis of the upper plot in Fig. 5 represents phase difference, not the phase.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.