{"title":"Development of a Miniaturized Testing System for Resonant Frequency Difference Detection for Delay Line Surface Acoustic Wave Devices","authors":"Tao Li;Rui Sun;Rong Zhang;Cuiping Li;Huimin Liu","doi":"10.1109/LES.2024.3486992","DOIUrl":null,"url":null,"abstract":"This letter presents a resonant frequency difference (RFD) readout system for a surface acoustic wave (SAW) device using the feedback/loop method. The proposed miniaturized testing system with a nice interactive interface which offers a reliable and accurate solution for real-time monitoring of RFD signals. The design details of the system, including the selection of components, circuitry, and signal processing techniques, are discussed. Compare with the theoretical analysis results of commercial vector network analyzer, the test results error of this system do not exceed 0.2%.","PeriodicalId":56143,"journal":{"name":"IEEE Embedded Systems Letters","volume":"17 3","pages":"200-203"},"PeriodicalIF":2.0000,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Embedded Systems Letters","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10745639/","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
This letter presents a resonant frequency difference (RFD) readout system for a surface acoustic wave (SAW) device using the feedback/loop method. The proposed miniaturized testing system with a nice interactive interface which offers a reliable and accurate solution for real-time monitoring of RFD signals. The design details of the system, including the selection of components, circuitry, and signal processing techniques, are discussed. Compare with the theoretical analysis results of commercial vector network analyzer, the test results error of this system do not exceed 0.2%.
期刊介绍:
The IEEE Embedded Systems Letters (ESL), provides a forum for rapid dissemination of latest technical advances in embedded systems and related areas in embedded software. The emphasis is on models, methods, and tools that ensure secure, correct, efficient and robust design of embedded systems and their applications.