Bhanprakash Goswami;Chithambara J. Moorthii;Harshit Bansal;Ayan Sajwan;Manan Suri
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引用次数: 0
Abstract
This study investigates vulnerabilities of future generation nonvolatile memory (NVM)-backed persistent TinyML hardware neural networks to side-channel attacks (SCAs) using electromagnetic (EM) analysis methods. We trained three different tinyML models: MobileNet, ResNet, and EfficientNet on three different standard datasets: F-MNIST, CIFAR-10, and MNIST. The trained networks were then mapped on to a custom FPGA-NVM setup for EM-SCA evaluation. We demonstrate that the information about the stored model parameters/weights can be extracted by applying statistical methods on the collected EM emanation data. Further, we demonstrate that the obtained model parametric information can be used for cloning some of the lightweight edge TinyML models with only 0.5%–10% of total training dataset.
期刊介绍:
The IEEE Embedded Systems Letters (ESL), provides a forum for rapid dissemination of latest technical advances in embedded systems and related areas in embedded software. The emphasis is on models, methods, and tools that ensure secure, correct, efficient and robust design of embedded systems and their applications.