{"title":"TENDRA: Targeted Endurance Attack on STT-RAM LLC","authors":"Prabuddha Sinha;Mangena Likhit Sai;Shirshendu Das;Venkata Kalyan Tavva","doi":"10.1109/LES.2024.3502297","DOIUrl":null,"url":null,"abstract":"Spin transfer torque RAM (STT-RAM)-based last level cache (LLC) offers significant benefits like high density and low refresh energy, but faces challenges like high write latency and limited endurance. Malicious attacks in a multicore setup need access to only a single core to perform repeated attacks on specific memory locations that can lead to an accelerated lifetime degradation of the STT-RAM LLC cells. To highlight this vulnerability of STT-RAM LLC, we propose two variations of TENDRA (targeted endurance attack), namely, recurring location attack (RLA) and recurring toggle attack (RTA). Our work highlights the efficiency of these attacks on modern counter-based wear leveling techniques and also the effect of wear leveling on these attacks.","PeriodicalId":56143,"journal":{"name":"IEEE Embedded Systems Letters","volume":"17 3","pages":"172-175"},"PeriodicalIF":2.0000,"publicationDate":"2024-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Embedded Systems Letters","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10757342/","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Spin transfer torque RAM (STT-RAM)-based last level cache (LLC) offers significant benefits like high density and low refresh energy, but faces challenges like high write latency and limited endurance. Malicious attacks in a multicore setup need access to only a single core to perform repeated attacks on specific memory locations that can lead to an accelerated lifetime degradation of the STT-RAM LLC cells. To highlight this vulnerability of STT-RAM LLC, we propose two variations of TENDRA (targeted endurance attack), namely, recurring location attack (RLA) and recurring toggle attack (RTA). Our work highlights the efficiency of these attacks on modern counter-based wear leveling techniques and also the effect of wear leveling on these attacks.
期刊介绍:
The IEEE Embedded Systems Letters (ESL), provides a forum for rapid dissemination of latest technical advances in embedded systems and related areas in embedded software. The emphasis is on models, methods, and tools that ensure secure, correct, efficient and robust design of embedded systems and their applications.