{"title":"Microcavity-based parallel measurements of optical power and wavelength","authors":"Yan Wang, Yu-Hao Hu, Jin-Lei Wu, Jian Tang, Ya-Feng Jiao, Ya-Chuan Liang, Hai-Yan Wang, Li-Ying Jiang, Le-Man Kuang, Ke-Yu Xia, Lei Shi, Hui Jing","doi":"10.1063/5.0268412","DOIUrl":null,"url":null,"abstract":"Accurate determination of light power and wavelength is fundamental to nearly all optical and laser applications. However, simultaneous and precise measurements of these two parameters remain a critical challenge due to intrinsic cross-sensitivity in conventional devices. Here, we propose and demonstrate a dual-parameter decoupling strategy based on photothermal whispering gallery mode (WGM) microcavities, enabling parallel measurements of both optical power and wavelength without cross-sensitivity. Optical absorption of the pump light by the composite microcavity produces increased temperatures that are proportional to the pump power and wavelength of the light, resulting in a wavelength shift in the WGM resonance of the microcavity. We demonstrate a record-high photothermal tuning sensitivity of ∼−4 nm/mW and an ultralow detection limit of thermal power down to 4 μW, both of which surpass all previous schemes by more than an order of magnitude. With a linear response to the pump wavelength, the designed microcavity allows for near-infrared wavelength measurement over a broad bandwidth from 780 to 1064 nm. Importantly, by introducing the decoupling strategy that employs spectral changes of two microcavities with asymmetric responses, we demonstrate parallel measurements of both optical power and wavelength with high accuracy. As the first proof-of-principle demonstration of a single optical power–wavelength measurer using optical microcavities, our work could advance various applications relying on miniaturized and precise optical metrology devices.","PeriodicalId":8200,"journal":{"name":"Applied physics reviews","volume":"12 1","pages":""},"PeriodicalIF":11.6000,"publicationDate":"2025-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied physics reviews","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0268412","RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate determination of light power and wavelength is fundamental to nearly all optical and laser applications. However, simultaneous and precise measurements of these two parameters remain a critical challenge due to intrinsic cross-sensitivity in conventional devices. Here, we propose and demonstrate a dual-parameter decoupling strategy based on photothermal whispering gallery mode (WGM) microcavities, enabling parallel measurements of both optical power and wavelength without cross-sensitivity. Optical absorption of the pump light by the composite microcavity produces increased temperatures that are proportional to the pump power and wavelength of the light, resulting in a wavelength shift in the WGM resonance of the microcavity. We demonstrate a record-high photothermal tuning sensitivity of ∼−4 nm/mW and an ultralow detection limit of thermal power down to 4 μW, both of which surpass all previous schemes by more than an order of magnitude. With a linear response to the pump wavelength, the designed microcavity allows for near-infrared wavelength measurement over a broad bandwidth from 780 to 1064 nm. Importantly, by introducing the decoupling strategy that employs spectral changes of two microcavities with asymmetric responses, we demonstrate parallel measurements of both optical power and wavelength with high accuracy. As the first proof-of-principle demonstration of a single optical power–wavelength measurer using optical microcavities, our work could advance various applications relying on miniaturized and precise optical metrology devices.
期刊介绍:
Applied Physics Reviews (APR) is a journal featuring articles on critical topics in experimental or theoretical research in applied physics and applications of physics to other scientific and engineering branches. The publication includes two main types of articles:
Original Research: These articles report on high-quality, novel research studies that are of significant interest to the applied physics community.
Reviews: Review articles in APR can either be authoritative and comprehensive assessments of established areas of applied physics or short, timely reviews of recent advances in established fields or emerging areas of applied physics.