Xiaoyong He , Liwen Hu , Wanyan Cheng , Jun Quan , Yarui Wang , Hongcheng Wang
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引用次数: 0
Abstract
This work aimed to address the limitations of traditional methods in the elemental analysis of magnesium alloys. The femtosecond laser-ablation spark-induced breakdown spectroscopy (fs-LA-SIBS) technique combined with the calibration-free (CF) quantitative analysis method was employed. By optimizing experimental parameters, including discharge capacitance, voltage, resistance, laser single-pulse energy, and delay time, the spectral signal intensity and stability were enhanced. The limits of detection for various elements were determined. Through the CF method, the electron density and plasma temperature were calculated, and the quantitative analysis of multiple elements in standard magnesium alloy samples was carried out. The results showed relative errors within 30 % for most elements (e.g., Al: 3.9 %, Zn: 3.3 %), indicating high precision and stability in the elemental analysis of magnesium alloys.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.