A.N. Busygin , A.D. Pisarev , S. Yu Udovichenko , A.H.A. Ebrahim
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引用次数: 0
Abstract
A compact electrical circuit of a memory device based on a memristor-diode crossbar array and peripheral CMOS control logic has been developed. The peripheral logic circuit is digitally controlled and allows reading and changing the state of individual memristors. This functionality is necessary to store and transfer the synaptic states of the neural network to another neural network to avoid re-learning. Simple original electrical circuits of input and output drivers utilizing standard rectangular impulses to control memristor-diode crossbar were created. These circuits ensure the operation of the memristor matrix both as part of the hardware spiking neural network and in the modes of writing and reading the state of the memristors. Exclusion of multiple DACs and ADCs in the electrical circuits of input and output crossbar conductor drivers made it possible to significantly reduce the occupied area on the chip. On the basis of numerical modeling using the experimental characteristics of memristors the maximum size of crossbar in the developed circuit and the influence of parasitic currents on the processes of writing and reading the state of memristors are estimated. Connection of the peripheral logic circuit in the memristor leads to a limitation of the maximum size of the crossbar due to additional parasitic currents. A method of compensating the influence of parasitic currents on the process of setting memristors in a given state by varying the duration of programming pulses is proposed.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.