The Inverse Scattering of Second-Order Nonlinear Media Based on Distorted Born Iterative Method

IF 5.8 1区 计算机科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Shi Qiang Wu;Bo O. Zhu
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引用次数: 0

Abstract

Nonlinear media are the building blocks for nonlinear optical devices. The parameter retrieval of nonlinear media is an important problem for nonlinear optics. However, the maturity and accuracy of nonlinear media retrieval methods lag behind that of ordinary linear media retrieval methods because it is difficult to analytically solve the Maxwell equations containing nonlinear media. Various approximations and simplifications have to be made in order to derive the analytical formulas for nonlinear parameter retrievals. Since the material’s electromagnetic (EM) parameter retrieval problem belongs to the EM inverse scattering problem, the accuracy of nonlinear media parameter retrievals can be improved if EM inverse scattering techniques, which are full-wave numerical methods, can be employed. Conventionally, EM inverse scattering methods work for linear media. In this communication, we generalize the distorted Born iterative method (DBIM), which is a popular EM inverse scattering method for linear media, to the second-order nonlinear media case. The numerical tests show that the nonlinear parameter distribution of a 1-D problem can be determined with the generalized DBIM.
基于畸变Born迭代法的二阶非线性介质逆散射
非线性介质是非线性光学器件的基本材料。非线性介质的参数反演是非线性光学中的一个重要问题。然而,由于包含非线性介质的Maxwell方程组难以解析求解,非线性介质检索方法的成熟度和精度都落后于普通线性介质检索方法。为了导出非线性参数反演的解析公式,必须进行各种近似和简化。由于材料的电磁参数反演问题属于电磁逆散射问题,因此利用电磁逆散射技术(全波数值方法)可以提高非线性介质参数反演的精度。传统上,电磁逆散射方法适用于线性介质。在本文中,我们将线性介质中常用的电磁逆散射方法——畸变玻恩迭代法(DBIM)推广到二阶非线性介质中。数值试验表明,广义DBIM可以确定一维问题的非线性参数分布。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
10.40
自引率
28.10%
发文量
968
审稿时长
4.7 months
期刊介绍: IEEE Transactions on Antennas and Propagation includes theoretical and experimental advances in antennas, including design and development, and in the propagation of electromagnetic waves, including scattering, diffraction, and interaction with continuous media; and applications pertaining to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques
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