Lei Yang, Yun-Zhe Zheng, Abliz Mattursun, Ya-Qiong Wang, Zhao Guan, Rong Huang, Yan Cheng, Bin-Bin Chen, Ping-Hua Xiang, Chun-Gang Duan, Ni Zhong
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引用次数: 0
Abstract
Achieving stable and persistent polarization characteristics in ferroelectric (FE) materials is crucial for fabricating high-density, low-power multifunctional memories. In this study, we conducted a comprehensive investigation of the 2D FE material CuInP2S6 (CIPS), employing piezoelectric force microscopy (PFM), scanning transmission electron microscopy (STEM), and Raman spectroscopy. By comparing CIPS with and without the nonferroelectric (NFE) phase, we observed unexpected stability of the domain framework at high temperatures. This was evidenced by in situ temperature-dependent PFM measurements and Raman spectra. STEM analysis revealed Cu ion defects and charge accumulation at the FE/NFE interface, which contributed to the thermal stability due to a strong pinning effect. This work highlights the significant positive impact of NFE phases on the thermal stability of FE CIPS, providing insights into the development of controllable FE polarization switching and the potential application of highly reliable and durable multifunctional devices.
期刊介绍:
ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.