Absolute intensity normalization of powder neutron scattering data

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Joseph A. M. Paddison
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引用次数: 0

Abstract

An important property of neutron diffraction data is that they can be normalized in absolute intensity units. In practice, however, such normalization is seldom performed, since it can be time consuming and subject to systematic uncertainties. Here, a straightforward approach is presented for absolute intensity normalization of neutron diffraction data from polycrystalline samples. This approach uses the intensity scale factor obtained from a Rietveld refinement to normalize the data to the nuclear Bragg profile of the sample. Factors to convert the Rietveld scale factor into an absolute normalization factor are tabulated for constant-wavelength and time-of-flight data refined using the popular programs FullProf and GSAS-II. An example of the application of this method to experimental data is presented. Advantages, disadvantages and extensions of this approach to spectroscopic data are discussed.

粉末中子散射数据的绝对强度归一化
中子衍射数据的一个重要性质是它们可以用绝对强度单位归一化。然而,在实践中,这种规范化很少被执行,因为它可能是耗时的,并且受制于系统的不确定性。本文提出了一种对多晶样品中子衍射数据进行绝对强度归一化的简单方法。这种方法使用从Rietveld细化中获得的强度尺度因子将数据归一化到样品的核布拉格剖面。将Rietveld尺度因子转换为绝对归一化因子的因子表为恒定波长和飞行时间数据,使用流行的程序FullProf和GSAS-II进行细化。最后给出了该方法在实验数据中的应用实例。讨论了这种光谱数据处理方法的优点、缺点和扩展。
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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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