João L. Biondo Neto, Junior Cintra Mauricio, Cristiane B. Rodella
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引用次数: 0
Abstract
Synchrotron radiation X-ray diffraction facilities equipped with fast area detectors can generate X-ray diffraction (XRD) patterns in seconds. This capability is fundamental to revealing transient crystalline phases and the structural evolution of samples and devices for technology applications. However, it generates XRD patterns usually faster than the user can process during the experiment. Thus, an open-source and user-friendly software package named IGUAPE was developed for the PAINEIRA beamline (Sirius, Brazil). It allows visualization of the X-ray diffractograms as soon as the azimuthal integration of the Debye rings is processed and the XRD pattern is created. The software can also perform a single-peak qualitative analysis of the diffraction data. Upon selecting a diffraction peak in the XRD pattern, the peak position, integrated area and full width at half-maximum variation during the in situ or operando experiment are given.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.