Xiaopeng Diao , Zhiyong Zhu , Kaifei Fang , Hao Wen , Lishuang Lin , Ping Li , Hua Fan , Qi Wei , Quanyuan Feng
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引用次数: 0
Abstract
This work presents a valley-sensed emulated peak current-mode controlled buck converter specifically optimized for high-performance double data rate synchronous dynamic random access memory (DDR SDRAM) applications. In this work, a dual-channel synchronous buck converter is designed to provide a low voltage required for DDR applications. Building upon traditional emulated peak current-mode control, an innovative circuit structure with configurable pre-bias current sensing is introduced. This enhancement ensures that current sensing components are protected from high voltage stress and prevents sub-harmonic oscillations in the current sensing circuit. More importantly, it enables bidirectional switching of source and sink currents, which is essential for DDR power supply solutions. Experimental verification and testing results demonstrate that the dual-channel buck converter has an input voltage range of 3.3 V to 15 V, with a maximum output sourcing current of 6 A and a peak sinking current of 3 A. The chip is fabricated using 180 nm Bipolar-CMOS-DMOS (BCD) process technology, featuring a minimum turn-on time of 132 ns, a minimum turn-off time of 400 ns, and an operating frequency of 300 kHz. The overall chip dimensions are 2.2 mm 3.1 mm, while the core area, excluding pads, measures 1.8 mm 2.7 mm.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.