Quantitative Analysis of Electrical Tree Growth With Partial Discharge Characteristics of PCB Double Layer Under AC Voltage

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Jianhong Song;Zepeng Lv;Kai Wu;Yonghong Cheng;Zhenyu Wu;Xianghuan Zeng;Steven Qi Li
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Abstract

With the development of electronic technology, electronic devices are moving toward high power and miniaturization. Printed circuit board (PCB), as an important insulation support in electronic devices, is difficult to meet the development needs of power electronic devices. As an important insulation degradation phenomenon, the electric tree is also detected in PCBs. However, the issue of insulation degradation between PCB layers has not been thoroughly studied. In this article, a V-shape double-layer electrode is designed to investigate the insulation failure caused by the electrical tree between layers of PCB. By analyzing the phase-resolved partial discharge (PRPD) pattern and voltage difference (dV) plots of electrical tree growth, the partial discharge (PD) characteristics and electrical tree growth characteristics at different stages of electrical tree growth between layers are studied. PD inception voltage (PDIV) ( ${V}_{\text {I}}$ ) and PD extinction voltage ( ${V}_{\text {X}}$ ) during the growth of a nonconductive tree are estimated. The quantitative relationship between PD and tree length is investigated. It is found that PD maximum magnitude and ${V}_{\text {I}}-{V}_{\text {X}}$ and tree length show a linear relationship in the stage of nonconductive tree growth. The ratio of PD maximum magnitude to ${V}_{\text {I}}-{V}_{\text {X}}$ and tree length is approximately equal to a constant. To explain the relationship between tree length and PD maximum magnitude, ${V}_{\text {I}}$ and ${V}_{\text {X}}$ in the non-conductive tree, a dynamic PD propagation in nonelectric tree model is proposed. This method can quantitatively analyze the electrical defects of power equipment only through PD information. This has great potential for application in the defect assessment of PCBs.
交流电压下PCB双层部分放电特性的树生长定量分析
随着电子技术的发展,电子器件正朝着大功率、小型化的方向发展。印刷电路板(PCB)作为电子器件中重要的绝缘支撑,已难以满足电力电子器件的发展需求。作为一种重要的绝缘退化现象,电树现象也存在于pcb中。然而,PCB层之间的绝缘退化问题还没有得到深入的研究。本文设计了一种v型双层电极,用于研究PCB层间电树造成的绝缘失效。通过分析电树生长的相分辨局部放电(PRPD)图和电压差(dV)图,研究了电树生长层间不同阶段的局部放电(PD)特性和电树生长特性。估计了非导电树生长过程中放电起始电压(PDIV) (${V}_{\text {I}}$)和放电消光电压(${V}_{\text {X}}$)。研究了PD与树长之间的定量关系。发现在非导电树生长阶段,PD最大值与${V}_{\text {I}}-{V}_{\text {X}}$和树长呈线性关系。PD最大幅度与${V}_{\text {I}}-{V}_{\text {X}}$和树长度的比值近似等于一个常数。为了解释非导电树中PD最大幅值${V}_{\text {I}}$和${V}_{\text {X}}$与树长度之间的关系,提出了一种动态PD在非电树中的传播模型。该方法仅通过PD信息就能定量分析电力设备的电气缺陷。这在pcb缺陷评估中具有很大的应用潜力。
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
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