Nanostructured materials characterized by scanning photoelectron spectromicroscopy.

Abstract

Nanostructured materials play a key role in modern technologies adding new functionalities and improving the performance of current and future applications. Due to their nature resulting in diffused heterogeneous structures (chemical and electronic composition typically organized in phases or building blocks) characterizing these materials needs state of the art technologies which combine nanometer spatial resolution, environmental reliability, and operando capabilities. Scanning photoelectron spectromicroscopy (SPEM) is one of the characterization tools that combine high spectral resolution X-ray photoelectron spectroscopy with submicron spatial resolution. In particular, the SPEM equipment hosted at the ESCA microscopy beamline at Elettra is capable of in situ and operando analysis regardless of sample morphology. The review presents three different case studies illustrating the capabilities of SPEM in the investigation of catalytic materials in different conditions and processes.