A highly responsive UV photodetector based on WO3–ZnO layered thin film

IF 3.8 3区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Richa Kumari , Anil Kumar , Sandeep Dahiya , S.K. Srivastava , Debanjan Guin , Chandra Shekhar Pati Tripathi
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引用次数: 0

Abstract

This work focuses on the development of a heterostructure ultraviolet photodetector constructed using tungsten oxide (WO3) nanosheets (NSs) and zinc oxide (ZnO) nanoparticles (NPs), fabricated on Si/SiO2 substrates. For synthesis, a simple, economically feasible hydrothermal for WO3 and sol-gel synthesis approach for ZnO was used. The WO3 NSs/ZnO NPs heterostructure thin-film UV photodetector demonstrates excellent performance, including high responsivity (R), and detectivity (D) of 97.55 A/W, and 6.5 × 1011 Jones, respectively, when exposed to UV light (λ ∼ 365 nm). The working mechanism of the fabricated photodetector explained using a suitable energy band diagram. The WO3 NSs/ZnO NPs heterostructure thin-film UV photodetector exhibits a satisfactory response time, with a rise time of 5.35 s and a fall time of 10.24 s.
基于WO3-ZnO层状薄膜的高响应紫外光电探测器
本研究的重点是在Si/SiO2衬底上,利用氧化钨(WO3)纳米片(NSs)和氧化锌(ZnO)纳米颗粒(NPs)构建异质结构紫外探测器。采用简单、经济可行的水热法制备WO3,溶胶-凝胶法制备ZnO。wo3nss /ZnO NPs异质结构薄膜紫外探测器在紫外光(λ ~ 365 nm)下具有较高的响应率(R)和检出率(D),分别为97.55 A/W和6.5 × 1011 Jones。用合适的能带图解释了光电探测器的工作机理。wo3nss /ZnO NPs异质结构薄膜紫外探测器具有较好的响应时间,上升时间为5.35 s,下降时间为10.24 s。
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来源期刊
Optical Materials
Optical Materials 工程技术-材料科学:综合
CiteScore
6.60
自引率
12.80%
发文量
1265
审稿时长
38 days
期刊介绍: Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review. The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials. OPTICAL MATERIALS focuses on: • Optical Properties of Material Systems; • The Materials Aspects of Optical Phenomena; • The Materials Aspects of Devices and Applications. Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.
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