Simultaneous improvement of permittivity and nonlinear properties and loss tangent reduction through semi-wet route in NiO-modified CaCu3Ti4O12 ceramics: grain boundaries effect

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Salam Rhouma, Adel Megriche, Emna Souidi, Senda Said, Cécile Autret-Lambert
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引用次数: 0

Abstract

In this study, NiO-modified CaCu3Ti4O12 (CCTO–xNiO) ceramics were successfully synthesized via a semi-wet route, achieving simultaneous enhancement of dielectric and nonlinear properties while reducing dielectric losses. Unlike conventional solid-state methods, this approach offers improved control over grain morphology, leading to a significant reduction in energy dissipation. The impact of NiO doping (x = 0.01, 0.06, 0.15, 0.2) on the microstructure and dielectric characteristics of CCTO ceramics was systematically investigated. SEM analysis revealed a grain size increase from 2.53 µm (x = 0) to 11.46 µm (x = 0.06), followed by a decrease to 1.83 µm (x = 0.15) and 1.03 µm (x = 0.2), demonstrating the effect of NiO on grain growth inhibition. A minor quantity of NiO (x = 0.06) promoted grain growth, leading to enhanced dielectric and electrical properties. The 6% NiO sample exhibited the highest permittivity of 1.2 × 105 at 1 kHz, while the 15% NiO sample displayed the lowest dielectric loss (~ 0.02 at 1 kHz), a higher breakdown voltage (~ 4640 V·cm⁻1), and an enhanced nonlinear coefficient (~ 5.55), confirming its improved insulating performance. These enhancements are attributed to a synergistic effect between NiO doping and grain boundary modifications, as explained by the Schottky barrier and internal barrier layer capacitor (IBLC) models. This study provides new insights into microstructure-property relationships in CCTO ceramics, paving the way for the development of advanced dielectric materials with optimized performance for energy storage and capacitor applications.

nio改性ccu3ti4o12陶瓷的半湿法同时改善介电常数和非线性性能并降低损耗切线:晶界效应
在本研究中,通过半湿法成功合成了nio修饰的CaCu3Ti4O12 (CCTO-xNiO)陶瓷,在降低介电损耗的同时,实现了介电和非线性性能的同时增强。与传统的固态方法不同,这种方法可以更好地控制晶粒形态,从而显著降低能量耗散。系统研究了NiO掺杂(x = 0.01, 0.06, 0.15, 0.2)对CCTO陶瓷微结构和介电特性的影响。SEM分析显示,晶粒尺寸从2.53µm (x = 0)增大到11.46µm (x = 0.06),随后减小到1.83µm (x = 0.15)和1.03µm (x = 0.2),表明NiO对晶粒生长的抑制作用。少量的NiO (x = 0.06)促进了晶粒的生长,从而提高了介电性能和电学性能。6% NiO样品在1 kHz时的介电常数最高,为1.2 × 105,而15% NiO样品在1 kHz时的介电损耗最低(~ 0.02),击穿电压较高(~ 4640 V·cm⁻1),非线性系数提高(~ 5.55),证实了其绝缘性能的提高。正如肖特基势垒和内势垒层电容器(IBLC)模型所解释的那样,这些增强归因于NiO掺杂和晶界修饰之间的协同效应。该研究为CCTO陶瓷的微结构-性能关系提供了新的见解,为开发具有优化性能的先进介电材料铺平了道路,用于储能和电容器应用。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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