The evidence of samarium substitution defect contributing to local structural-polar heterogeneity and Tc in Sm-doped 0.68PMN-0.32PT ceramics compensated by B-site vacancies

IF 2.5 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Jing Yang, Wenjun Wang, Yan Li, Shaorong Feng, Tao Zhang, Xuping Niu, Min Li, Li’An Han, Xingzhong Cao, Runsheng Yu, Baoyi Wang
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引用次数: 0

Abstract

B-site vacancy is introduced by component design to provide an easy way to detect samarium substitution defects in Sm-doped 0.68PMN-0.32PT ceramics (The optimum d33 = 1004 pC/N for x = 0.025). The thorough examination of defects through positron annihilation lifetime and coincidence Doppler broadening spectroscopy indicates that with increasing Sm doping, defects as well as \(V_B^{''''}\) related defects increase, while \(V_A^{''}\) and \($$V_o^{ \bullet \bullet }$$\) decrease. The correlation analysis between the variation of defects and the results of dielectric, piezoelectric and ferroelectric tests offers powerful and conclusive proof that defects contribute to the local structural heterogeneity as well as the variation of TC. The variation of ferroelectric, dielectric and piezoelectric parameters with Sm-doping content is ascribed to the superposition effect of the contribution from \(Sm_{Pb}^ \cdot\) defects and the contribution from \($$V_A^{''}\,V_B^{''''}\,V_o^{ \bullet \bullet }$$\).

Abstract Image

钐取代缺陷导致sm掺杂0.68PMN-0.32PT陶瓷的局部结构极性非均质性和Tc被b位空位补偿的证据
通过元件设计引入b位空位,为检测sm掺杂0.68PMN-0.32PT陶瓷中的钐取代缺陷提供了一种简便的方法(x = 0.025时,最佳d33 = 1004 pC/N)。通过正电子湮灭寿命和重合多普勒展宽光谱对缺陷进行了深入研究,发现随着Sm掺杂量的增加,缺陷和\(V_B^{''''}\)相关缺陷增加,而\(V_A^{''}\)和\($$V_o^{ \bullet \bullet }$$\)相关缺陷减少。通过对缺陷变化与介电、压电和铁电测试结果的相关性分析,有力地证明了缺陷导致了局部结构的非均质性以及TC的变化。铁电、介电和压电参数随sm掺杂量的变化归因于\(Sm_{Pb}^ \cdot\)缺陷和\($$V_A^{''}\,V_B^{''''}\,V_o^{ \bullet \bullet }$$\)缺陷贡献的叠加效应。
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来源期刊
Applied Physics A
Applied Physics A 工程技术-材料科学:综合
CiteScore
4.80
自引率
7.40%
发文量
964
审稿时长
38 days
期刊介绍: Applied Physics A publishes experimental and theoretical investigations in applied physics as regular articles, rapid communications, and invited papers. The distinguished 30-member Board of Editors reflects the interdisciplinary approach of the journal and ensures the highest quality of peer review.
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