Enhanced sensitivity, structural, optical, magnetic properties, and thermal behaviour of Zn–Mg nanoferrites thick-film nanosensors for carbon monoxide (CO) gas detection study

IF 2.8 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Materials Science: Materials in Electronics Pub Date : 2025-05-26 DOI:10.1007/s10854-025-14966-x

Jadhav Vyankati Rama, Bhise Ramesh Baburao, Manisha Daryao Dhiware

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Abstract

The synthesis of magnesium-zinc nanoferrite (ZnMgFeO₄) via the sol–gel auto-combustion method and the fabrication of thick-film sensors using a screen technique resulted in the production of single-phased samples, characterized by crystallite sizes ranging from 16 to 18 nm. X-ray diffraction analysis revealed an expansion in lattice parameter with Magnesium doping, indicating unit cell enlargement. FT-IR spectroscopy confirmed the substitution of magnesium ions in the octahedral sites. Optical measurements demonstrated a reduction in UV–visible spectroscopy with doping, attributed to particle size dependence. This comprehensive study sheds light on the structural, optical, and thermal (TG–DTA). Magnetic measurements signify decreased magnetization with Mg-ZnFe₂O₄ attributed to particle size dependence. Sensor modification made specifically was for gas detection of CO made sensitivity of 77.58% of Mg-doped Zn ferrite nanomaterials, offering valuable insights for CO gas detection.

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Zn-Mg纳米铁氧体厚膜纳米传感器用于一氧化碳气体检测的灵敏度、结构、光学、磁性和热行为研究

通过溶胶-凝胶自燃烧法合成镁锌纳米铁氧体（ZnMgFeO4），并利用屏幕技术制备厚膜传感器，得到了晶粒尺寸在16 ~ 18 nm之间的单相样品。x射线衍射分析显示，镁掺杂后晶格参数扩大，表明单晶增大。傅里叶变换红外光谱证实了镁离子在八面体位置的取代。光学测量表明，由于颗粒大小的依赖性，掺杂降低了紫外可见光谱。这项综合研究揭示了结构、光学和热（TG-DTA）。磁性测量表明，由于颗粒大小的依赖性，Mg-ZnFe2O4的磁化强度降低。对传感器进行改造，专门用于CO气体检测，使mg掺杂Zn铁氧体纳米材料的灵敏度达到77.58%，为CO气体检测提供了有价值的见解。

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来源期刊

Journal of Materials Science: Materials in Electronics 工程技术-材料科学：综合

CiteScore

5.00

自引率

7.10%

发文量

1931

审稿时长

2 months

期刊介绍： The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.