{"title":"Adaptive AFM image reconstruction through frequency coefficient selection based on block compressed sensing","authors":"Yifan Hu, Yingzi Li, Peng Cheng, Rui Lin, Jianqiang Qian, Quan Yuan, Yanan Chen","doi":"10.1016/j.micron.2025.103849","DOIUrl":null,"url":null,"abstract":"<div><div>Atomic force microscope (AFM) is a valuable instrument for nano-scale imaging. Traditional AFM demands long time to obtain AFM images due to point-by-point imaging. AFM based on compressed sensing (CS-AFM) is able to obtain AFM images by reconstructing from incomplete measurement. Block compressed sensing (BCS) further shortens the reconstruction time but focuses on the topography of samples, which loses necessary frequency information. Different subblocks exhibit various characteristics by sparse transformation. In this paper an adaptive frequency coefficient selection method based on BCS is proposed to enhance reconstruction quality. We focus on the frequency domain of the AFM image, applying sparse transformation to obtain the corresponding frequency coefficients. We then select partial coefficients from all frequency components as the feature information for each subblock during reconstruction, followed by an inverse sparse transformation to obtain the final reconstructed image. The proposed method outperforms both iterative selection-based BCS and ordinary BCS, achieving the highest PSNR and SSIM values across various sampling ratio while maintaining comparable reconstruction times, which verifies its ability to fast reconstruct AFM images with high quality.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"196 ","pages":"Article 103849"},"PeriodicalIF":2.2000,"publicationDate":"2025-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0968432825000678","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0
Abstract
Atomic force microscope (AFM) is a valuable instrument for nano-scale imaging. Traditional AFM demands long time to obtain AFM images due to point-by-point imaging. AFM based on compressed sensing (CS-AFM) is able to obtain AFM images by reconstructing from incomplete measurement. Block compressed sensing (BCS) further shortens the reconstruction time but focuses on the topography of samples, which loses necessary frequency information. Different subblocks exhibit various characteristics by sparse transformation. In this paper an adaptive frequency coefficient selection method based on BCS is proposed to enhance reconstruction quality. We focus on the frequency domain of the AFM image, applying sparse transformation to obtain the corresponding frequency coefficients. We then select partial coefficients from all frequency components as the feature information for each subblock during reconstruction, followed by an inverse sparse transformation to obtain the final reconstructed image. The proposed method outperforms both iterative selection-based BCS and ordinary BCS, achieving the highest PSNR and SSIM values across various sampling ratio while maintaining comparable reconstruction times, which verifies its ability to fast reconstruct AFM images with high quality.
期刊介绍:
Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.