Study on the wettability, intermetallic compound growth, voids formation and mechanical properties of Cu/Sn joints with changes in substrate roughness for electronic packaging
IF 2.8 4区 工程技术Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Yibo Hu, Jieshi Chen, Yi Zhen, YuZhu Han, Chun Yu, Kai Xiong, Shuye Zhang
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引用次数: 0
Abstract
The study investigates the effects of roughness changes on the wettability, intermetallic compound growth, voids formation, and shear mechanics of Cu/Sn joints by preparing microtextures with different intervals on the Cu surface using femtosecond laser. The study found that the roughness of the substrate increased from 0.03 μm to 0.09 μm ~ 0.16 μm after laser treatment, and the corresponding wetting angle decreased from 49.75° to 30° ~ 40° due to the formation of periodic grooves after ultrafast laser processing, which created energy barriers that reduced the spreading ability and wettability of liquid metal. During the variation of surface roughness, the thickness of the intermetallic compounds (IMCs) is the greatest at the maximum roughness level both before and after thermal ageing. After 168 h of thermal treatment, a significant number of voids are generated at the joint with the maximum roughness. The joint with a roughness of 0.16 μm exhibits the fastest growth rate of IMCs thickness, while the joint with the maximum roughness shows the lowest shear strength. Additionally, as the roughness decreases, the fracture mode transitions from ductile fracture to brittle fracture. The reasons for the aforementioned phenomena are that the changes in roughness lead to variations in nucleation at the interface during the liquid-state process, which in turn affect the diffusion channels at the interface and ultimately cause unbalanced diffusion of copper and tin.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.