Rajib Sahu , Peter J. Pöllmann , Dimitri Bogdanovski , Clio Azina , Ganesh Kumar Nayak , Jochen M. Schneider , Christina Scheu
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引用次数: 0
Abstract
We report on the microstructural characterization of a multilayer AlOx-Cr2AlC thin film grown at 580 °C by direct current magnetron sputtering. Instead of stabilizing a two-dimensional carbide derivative, intentional periodic excess oxygen incorporation during thin film deposition leads to the formation of a 3D-Cr2(C1-yOy) phase within the AlOx-Cr2AlC multilayered film. The microstructure of the film was investigated by combining various imaging techniques in aberration corrected scanning transition electron microscopy. The distribution of C and related defects at atomic scale was revealed by the integrated differential phase contrast method.
期刊介绍:
Applied Surface Science covers topics contributing to a better understanding of surfaces, interfaces, nanostructures and their applications. The journal is concerned with scientific research on the atomic and molecular level of material properties determined with specific surface analytical techniques and/or computational methods, as well as the processing of such structures.