{"title":"Robust Vision-Based Target Outline Reconstruction and In-Plane Trajectory Measurement","authors":"Sicheng Hong;Yuyong Xiong;Yingjie Gou;Qingbo He;Zhike Peng","doi":"10.1109/TIM.2025.3565061","DOIUrl":null,"url":null,"abstract":"Noncontact vision-based in-plane displacement and posture trajectory measurement is essential in structural health monitoring, aerospace, and related fields. However, current techniques such as optical flow and digital image correlation (DIC), remain challenges under intensity-varying and noise-interfered test scenes. To this end, by leveraging on binary segmentation and new line fitting method, this article introduces a novel target outline reconstruction (TOR) method for dynamic target tracking, creating an approach for robust vision-based in-plane displacement and posture parameter measurements. The reconstruction process begins with target-background separation, applying a binarization algorithm combined with edge extraction to obtain the initial target outline. In parallel, image processing with convolution forms the gradient value coordinate, filtering the densest regions to net the qualified points for edge line reconstruction. The TOR method was evaluated in various test scenes with background light shadowing. Experimental results demonstrate that target displacement and posture parameters are well monitored with high accuracy and robustness.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-12"},"PeriodicalIF":5.6000,"publicationDate":"2025-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10979476/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Noncontact vision-based in-plane displacement and posture trajectory measurement is essential in structural health monitoring, aerospace, and related fields. However, current techniques such as optical flow and digital image correlation (DIC), remain challenges under intensity-varying and noise-interfered test scenes. To this end, by leveraging on binary segmentation and new line fitting method, this article introduces a novel target outline reconstruction (TOR) method for dynamic target tracking, creating an approach for robust vision-based in-plane displacement and posture parameter measurements. The reconstruction process begins with target-background separation, applying a binarization algorithm combined with edge extraction to obtain the initial target outline. In parallel, image processing with convolution forms the gradient value coordinate, filtering the densest regions to net the qualified points for edge line reconstruction. The TOR method was evaluated in various test scenes with background light shadowing. Experimental results demonstrate that target displacement and posture parameters are well monitored with high accuracy and robustness.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.